InGaP/GaAs(001) structural characterization by means of synchrotron radiation Renninger Scan - Cardoso, Lisandro P.; Menezes, Alan S. de; Santos, Adenilson O. dos; Bortoleto, Jose R. [UNESP]; Cotta, Monica A.; Morelhao, Sergio L. (Int Union Crystallography, 2008)
Keywords: semiconductor epitaxy; X-ray multiple diffraction; strain determination