Bueno, Paulo Roberto [UNESP]Camargo, E.Longo, Elson [UNESP]Leite, E.Pianaro, S. A.Varela, José Arana [UNESP]2014-05-272014-05-271996-12-01Journal of Materials Science Letters, v. 15, n. 23, p. 2048-2050, 1996.0261-8028http://hdl.handle.net/11449/649372048-2050engCeramic materialsChromium compoundsCrystal microstructureCurrent densityElectric fieldsElectric impedanceElectric propertiesGrain boundariesNiobium compoundsScanning electron microscopyVaristorsX ray diffraction analysisElectrical behaviourImpedance analysisMolar concentrationTitanium dioxideArtigoWOS:A1996VZ41100011Acesso restrito2-s2.0-003041448104770459067332540000-0003-2827-0208