Del Cacho, V. D.Silva, D. M. daAssumpcao, T. A. A. deKassab, Luciana Reyes Pires [UNESP]Alayo, M. I.Melo, E. G.2015-03-182015-03-182014-12-01Optical Materials. Amsterdam: Elsevier Science Bv, v. 38, p. 198-203, 2014.0925-3467http://hdl.handle.net/11449/116688We report, for the first time to our knowledge, experimental results on pedestal waveguides produced with Yb3+/Er3+ codoped Bi2O3-WO3-TeO2 thin films deposited by RF Sputtering for photonic applications. Thin films were deposited using Ar/O-2 plasma at 5 mTorr pressure and RF power of 40 W on substrates of silicon wafers. The definition of the pedestal waveguide structure was made using conventional optical lithography followed by plasma etching. Propagation losses around 2.0 dB/cm and 2.5 dB/cm were obtained at 633 and 1050 nm, respectively, for waveguides in the 20-100 mu m width range. Single-mode propagation was measured for waveguides width up to 10 mu m and 12 mu m, at 633 nm and 1050 nm, respectively; for larger waveguides widths multi-mode propagation was obtained. Internal gain of 5.6 dB at 1530 nm, under 980 nm excitation, was measured for 1.5 cm waveguide length (similar to 3.7 dB/cm). The present results show the possibility of using Yb3+/Er3+ codoped Bi2O3-WO3-TeO2 pedestal waveguide for optical amplifiers. (C) 2014 Elsevier B.V. All rights reserved.198-203engPedestal waveguidesTellurite glassesOptical amplificationRF SputteringThin filmsOptical gainArtigo10.1016/j.optmat.2014.10.027WOS:000346228800034Acesso restrito