Costa, AFB2014-05-202014-05-201999-10-01Journal of Quality Technology. Milwaukee: Amer Soc Quality Control-asqc, v. 31, n. 4, p. 387-397, 1999.0022-4065http://hdl.handle.net/11449/31595Recent studies have shown that the (X) over bar chart with variable sampling intervals (VSI) and/or with variable sample sizes (VSS) detects process shifts faster than the traditional (X) over bar chart. This article extends these studies for processes that are monitored by both the (X) over bar and R charts. A Markov chain model is used to determine the properties of the joint (X) over bar and R charts with variable sample sizes and sampling intervals (VSSI). The VSSI scheme improves the joint (X) over bar and R control chart performance in terms of the speed with which shifts in the process mean and/or variance are detected.387-397engArtigoWOS:000083162800003Acesso restrito6100382011052492