Wettability and surface microstructure of polyamide 6 coated with SiOXCYHZ films - Vendemiatti, Caique; Hosokawa, Ricardo Shindi; Rangel, R. C. C.; Bortoleto, J. R. R.; Cruz, N. C.; Rangel, Elidiane Cipriano [UNESP] (Elsevier, 2015)
Keywords: Wettability; Polyamide 6; organosilicon films; PECVD; Morphology; Surface topography