Nozaki, Ricardo [UNESP]Balthazar, José Manoel [UNESP]Tusset, Angelo MarceloDe Pontes Jr., Bento Rodrigues [UNESP]Bueno, Átila Madureira2014-05-272014-05-272013-06-01Journal of Control, Automation and Electrical Systems, v. 24, n. 3, p. 223-231, 2013.2195-38802195-3899http://hdl.handle.net/11449/75502The performance of the optimal linear feedback control and of the state-dependent Riccati equation control techniques applied to control and to suppress the chaotic motion in the atomic force microscope are analyzed. In addition, the sensitivity of each control technique regarding to parametric uncertainties are considered. Simulation results show the advantages and disadvantages of each technique. © 2013 Brazilian Society for Automatics - SBA.223-231engAtomic force microscopy (AFM)ChaosOptimal linear feedback control (OLFC)State-dependent Riccati equation (SDRE)Atomic force microscope (AFM)Chaotic motionsControl techniquesLinear feedback controlParametric errorsParametric uncertaintiesState-dependent Riccati equationChaos theoryFeedback controlOptimizationAtomic force microscopyArtigo10.1007/s40313-013-0034-1Acesso restrito2-s2.0-84879400236