Pereira, D.Pisani, R.Nakamura, R.Papa, J. [UNESP]IEEE2018-11-262018-11-262015-01-012015 Ieee International Geoscience And Remote Sensing Symposium (igarss). New York: Ieee, p. 76-79, 2015.2153-6996http://hdl.handle.net/11449/161290Sequential learning-based pattern classification aims at providing more accurate labeled maps by adding an extra step of classification using an augmented feature vector. In this paper, we evaluated the robustness of Optimum-Path Forest (OPF) classifier in the context of land-cover classification using both satellite and radar images, showing OPF can benefit from sequential learning theoretical basis.76-79engLand-cover classificationOptimum-Path ForestSequential LearningTrabalho apresentado em eventoWOS:000371696700020Acesso aberto