Sidel, S. M. [UNESP]Santos, F. A. [UNESP]Gordo, V. O. [UNESP]Idalgo, E. [UNESP]Monteiro, A. A. [UNESP]Moraes, João Carlos Silos [UNESP]Yukimitu, K. [UNESP]2014-05-202014-05-202011-11-01Journal of Thermal Analysis and Calorimetry. Dordrecht: Springer, v. 106, n. 2, p. 613-618, 2011.1388-6150http://hdl.handle.net/11449/10034Nucleation process and crystal growth for three samples of the (20-x)Li(2)O-80TeO(2)-xWO(3) glass system were studied using X-ray diffraction and differential scanning calorimetry techniques. X-ray diffraction data confirmed the amorphous characteristic of the as-quenched samples and indicated the growth of crystalline phases formed due to the thermal treatment for annealed samples. These results reveal the presence of three distinct gamma-TeO(2), alpha-TeO(2) and alpha-Li(2)Te(2)O(5) crystalline phases in the TL sample, and two distinct alpha-TeO(2) and gamma-TeO(2) crystalline phases in the TLW5 and TLW10 samples. The activation energy and the Avrami exponent were determined from DSC measurements. The activation energy values X-ray diffraction data of the TLW10 glass sample suggest that gamma-TeO(2) phase occur before the alpha-TeO(2). The results obtained for the Avrami exponent point to that the nucleation process is volumetric and that the crystal growth is two or three-dimensional.613-618engTellurite glassesNucleationCrystallizationActivation energyXRDDSCAvrami exponent of crystallization in tellurite glassesArtigo10.1007/s10973-011-1312-4WOS:000296065100050Acesso restrito8507741729691974