Lima, E. C. [UNESP]Araujo, E. B. [UNESP]Souza Filho, A. G.Paschoal, A. R.Bdikin, I. K.Kholkin, A. L.2014-05-202014-05-202012-05-30Journal of Physics D-applied Physics. Bristol: Iop Publishing Ltd, v. 45, n. 21, p. 6, 2012.0022-3727http://hdl.handle.net/11449/10070The structural properties of Pb(Zr0.50Ti0.50)O-3 thin films with no preferential orientation were studied throughout the film thickness. An analysis on depth profile shows the existence of a significant (1 0 0) alignment near the film-electrode interface. Nanoscale piezoelectric measurements demonstrate the existence of a self-polarization effect in the studied films. An increase in this effect with film thickness increasing from 200 to 710 nm suggests that Schottky barriers and/or mechanical coupling near the film-electrode interface cannot be the main mechanisms responsible for the self-polarization effect in the studied films.6engArtigo10.1088/0022-3727/45/21/215304WOS:000304056100011Acesso restrito6725982228402054