Lima, E. C.Araujo, E. B. [UNESP]Bdikin, I. K.Kholkin, A. L.2014-12-032014-12-032014-06-11Ferroelectrics. Abingdon: Taylor & Francis Ltd, v. 465, n. 1, p. 106-114, 2014.0015-0193http://hdl.handle.net/11449/113647PbZr1-xTixO3 (PZT) thin films (x = 0.46, 0.47, 0.48, 0.49, and 0.50) were deposited on Pt/TiO2/SiO2/Si substrates using a polymeric chemical method to study the effects of the composition on the macroscopic electrical and local piezoelectric properties. Both measurements demonstrate the existence of a self-polarization effect in all studied PZT films. The measurements were discussed in terms of the contribution of the Schottky barriers to the self-polarization effect. It is shown that both Schottky barrier effect and mechanical coupling near the film-substrate interface are not the dominant mechanisms responsible for the observed phenomena.106-114engPiezoelectricpiezoresponseself-polarizationArtigo10.1080/00150193.2014.894391WOS:000335214400015Acesso restrito6725982228402054