Influence of Proton Radiation and Strain on nFinFET Zero Temperature Coefficient
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Data
2016-01-01
Autores
Nascimento, Vinicius M.
Agopian, Paula G. D. [UNESP]
Almeida, Luciano M.
Bordallo, Caio C. M.
Simoen, Eddy
Claeys, Cor
Martino, Joao A.
IEEE
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Editor
Ieee
Resumo
This paper presents for the first time the study of proton radiation and strain influence on the Zero Temperature Coefficient (ZTC) in SOI nFinFETs based on experimental data and simple analytical model. The strain improves the mobility and consequently the transconductance (gm) and reduces the threshold voltage (V-TH) due to the bandgap reduction. Proton radiation degrades gm and decreases V-TH mainly for wider fins. We observed experimentally that both parameters (gm and V-TH) influence the ZTC bias point, which is also supported by the ZTC analytical model. The V-TH influences directly the V-zTc in amplitude and the radiation the gm temperature degradation factor (c), consequently leading to undesired changes of V-zTc with temperature.
Descrição
Palavras-chave
SOT FinFET, Zero Temperature Coefficient, strain, radiation
Como citar
2016 31st Symposium On Microelectronics Technology And Devices (sbmicro). New York: Ieee, 4 p., 2016.