Retention characteristics of lanthanum-doped bismuth titanate films annealed at different furnaces
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Data
2009-05-15
Autores
Simões, Alexandre Zirpoli [UNESP]
Aguiar, E. C. [UNESP]
Longo, Elson [UNESP]
Varela, José Arana [UNESP]
Título da Revista
ISSN da Revista
Título de Volume
Editor
Elsevier B.V. Sa
Resumo
Lanthanum-doped bismuth titanate thin films (Bi(3.25)La(0.75)Ti(3)O(12) - BLT) were prepared by the polymeric precursor method and crystallized in the microwave and conventional furnaces. The obtained films are polycrystalline in nature and its ferroelectric properties were determined with remanent polarization P(r) and a coercive field E(c) of 3.9 mu C cm(-2) and 70 kVcm(-1) for the film annealed in the microwave furnace and 20 mu Ccm(-2) and 52 kVcm(-1) for the film annealed in conventional furnace, respectively. Better retention characteristics were observed in the films annealed in conventional furnace, indicating that our films can be a promise material for use in the future FeRAMS memories. (C) 2009 Elsevier B.V. All rights reserved.
Descrição
Palavras-chave
Thin films, Annealing, Atomic force microscopy, Ferroelectricity
Como citar
Materials Chemistry and Physics. Lausanne: Elsevier B.V. Sa, v. 115, n. 1, p. 434-438, 2009.