Determining the interfacial density of states in metal-insulator-semiconductor devices based on poly(3-hexylthiophene)
Carregando...
Data
2008-03-10
Autores
Alves, Neri [UNESP]
Taylor, D. M.
Título da Revista
ISSN da Revista
Título de Volume
Editor
American Institute of Physics (AIP)
Resumo
Low frequency admittance measurements are used to determine the density of interface states in metal-insulator-semiconductor diodes based on the unintentionally doped, p-type semiconductor poly(3-hexylthiophene). After vacuum annealing at 90 degrees C, interface hole trapping states are shown to be distributed in energy with their density decreasing approximately linearly from similar to 20x10(10) to 5x10(10) cm(-2) eV(-1) over an energy range extending from 0.05 to 0.25 eV above the bulk Fermi level. (c) 2008 American Institute of Physics.
Descrição
Palavras-chave
Como citar
Applied Physics Letters. Melville: Amer Inst Physics, v. 92, n. 10, p. 3, 2008.