Study of the influence of the rare earth elements (Ce3+ and Ce4+) concentration on the siloxanes coating applied on the copper surface
Nenhuma Miniatura disponível
Data
2012-12-01
Título da Revista
ISSN da Revista
Título de Volume
Editor
Resumo
This work studied the influence of the rare earth (Ce3+ and Ce4+) elements concentration in polysiloxane flints deposited on copper by dip-coating process, and evaluated their resistance in a 3.5 wt.% NaCl medium. Classical electrochemistry techniques were used as open circuit potential, polarization curves and electrochemical impedance spectroscopy. The results revealed that by adding low concentration of Ce4+ ions, the coating prevents the electrolyte uptake any longer retarding the substrate degradation consequently. ©The Electrochemical Society.
Descrição
Palavras-chave
Copper surface, Dip-coating process, Low concentrations, Open circuit potential, Polarization curves, Substrate degradation, Copper, Degradation, Electrochemical impedance spectroscopy, Electrochemistry, Silicon compounds, Silicones, Coatings
Como citar
ECS Transactions, v. 43, n. 1, p. 3-7, 2012.