Nonlinear control system applied to atomic force microscope including parametric errors
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Data
2013-06-01
Autores
Nozaki, Ricardo [UNESP]
Balthazar, José Manoel [UNESP]
Tusset, Angelo Marcelo
De Pontes Jr., Bento Rodrigues [UNESP]
Bueno, Átila Madureira
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Resumo
The performance of the optimal linear feedback control and of the state-dependent Riccati equation control techniques applied to control and to suppress the chaotic motion in the atomic force microscope are analyzed. In addition, the sensitivity of each control technique regarding to parametric uncertainties are considered. Simulation results show the advantages and disadvantages of each technique. © 2013 Brazilian Society for Automatics - SBA.
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Palavras-chave
Atomic force microscopy (AFM), Chaos, Optimal linear feedback control (OLFC), State-dependent Riccati equation (SDRE), Atomic force microscope (AFM), Chaotic motions, Control techniques, Linear feedback control, Parametric errors, Parametric uncertainties, State-dependent Riccati equation, Chaos theory, Feedback control, Optimization, Atomic force microscopy
Como citar
Journal of Control, Automation and Electrical Systems, v. 24, n. 3, p. 223-231, 2013.