Red shift and higher photoluminescence emission of CCTO thin films undergoing pressure treatment
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Data
2014-01-01
Autores
Sequinel, T. [UNESP]
Garcia, I. G. [UNESP]
Tebcherani, S. M.
Kubaski, E. T.
Oliveira, L. H. [UNESP]
Siu Li, M.
Longo, Elson [UNESP]
Varela, José Arana [UNESP]
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Resumo
CCTO thin films were deposited on Pt(1 1 1)/Ti/SiO2/Si substrates using a chemical (polymeric precursor) and pressure method. Pressure effects on CCTO thin films were evaluated by X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM) and optical properties which revealed that a pressure film (PF) is denser and more homogeneous than a chemical film (CF). Pressure also causes a decrease in the band gap and an increase in the photoluminescence (PL) emission of CCTO films which suggests that the pressure facilitates the displacement of Ti in the titanate clusters and the charge transference from TiO6 to [TiO5V0z], [TiO5V0z] to [CaO11V0z] and [TiO5V0z] to [CuO4]x. © 2013 Elsevier B.V. All rights reserved.
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CCTO, Photoluminescence, Pressure method, Thin films
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Journal of Alloys and Compounds, v. 583, p. 488-491.