Construction and test of low cost X-ray tomography scanner for physical-chemical analysis and nondestructive inspections

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dc.contributor.authorDe Oliveira Jr., José Martins
dc.contributor.authorMartins, Antonio César Germano [UNESP]
dc.contributor.institutionUniversidade de Sorocaba - UNISO
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-27T11:24:02Z
dc.date.available2014-05-27T11:24:02Z
dc.date.issued2009-11-27
dc.description.abstractX-ray computed tomography (CT) refers to the cross-sectional imaging of an object measuring the transmitted radiation at different directions. In this work, we describe the development of a low cost micro-CT X-ray scanner that is being developed for nondestructive testing. This tomograph operates using a microfocus X-ray source and contains a silicon photodiode as detectors. The performance of the system, by its spatial resolution, has been estimated through its Modulation Transfer Function - MTF and the obtained value at 10% of MTF is 661 μm. It was built as a general purpose nondestructive testing device. © 2009 American Institute of Physics.en
dc.description.affiliationUniversidade de Sorocaba - UNISO Campus Seminário, Caixa Postal 578, Av. Dr. Eugênio Salermo, 100, Centro, 18035-430, Sorocaba, SP
dc.description.affiliationUniversidade Estadual Paulista Julio de Mesquita Filho - UNESP GASI Alto da Boa Vista, Av. 3 de Março, 511, 18087-180, Sorocaba, SP
dc.description.affiliationUnespUniversidade Estadual Paulista Julio de Mesquita Filho - UNESP GASI Alto da Boa Vista, Av. 3 de Março, 511, 18087-180, Sorocaba, SP
dc.format.extent102-105
dc.identifierhttp://dx.doi.org/10.1063/1.3157786
dc.identifier.citationAIP Conference Proceedings, v. 1139, p. 102-105.
dc.identifier.doi10.1063/1.3157786
dc.identifier.file2-s2.0-70450214020.pdf
dc.identifier.issn0094-243X
dc.identifier.issn1551-7616
dc.identifier.scopus2-s2.0-70450214020
dc.identifier.urihttp://hdl.handle.net/11449/71250
dc.language.isoeng
dc.relation.ispartofAIP Conference Proceedings
dc.rights.accessRightsAcesso aberto
dc.sourceScopus
dc.subjectImage analysis
dc.subjectNondestructive inspections
dc.subjectTomography
dc.subjectX-ray
dc.titleConstruction and test of low cost X-ray tomography scanner for physical-chemical analysis and nondestructive inspectionsen
dc.typeTrabalho apresentado em evento
dcterms.licensehttp://publishing.aip.org/authors/web-posting-guidelines
unesp.author.lattes9625195382275378[2]
unesp.author.orcid0000-0002-7683-8729[2]

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