Dielectric behavior of XLPE aged under multi-stressing conditions

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dc.contributor.authorLeguenza, E. L.
dc.contributor.authorRobert, R.
dc.contributor.authorMoura, W. A.
dc.contributor.authorGiacometti, J. A. [UNESP]
dc.contributor.institutionCentro Universitário Positivo UNICENP
dc.contributor.institutionUniversidade Federal do Paraná (UFPR)
dc.contributor.institutionCentro Federal de Educação Tecnológica (CEFET)
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-27T11:21:41Z
dc.date.available2014-05-27T11:21:41Z
dc.date.issued2005-12-01
dc.description.abstractIn this work fresh cables were laboratory aged under multi-stressing conditions at room temperature. Foils were peeled from cables, with approximately 150 ?m thickness, from the outer, middle and inner positions of the XLPE cable insulating layer. For samples obtained from the outer cable layer position, an increasing near-permanent electrical conduction process with aging time was observed. At the middle and inner cable layer positions a flat-loss relaxation process was observed becoming a dominating process on the ageing. In addition, PEA results confirmed that degradation in the outer region of the XLPE cables arises from the simultaneous presence of dipoles and injected space charge that distorts the internal electric field on the ageing.en
dc.description.affiliationNúcleo de Ciências Exatas e Tecnológicas Engenharia da Computação Centro Universitário Positivo UNICENP, 81280-330, Curitiba PR
dc.description.affiliationLACTEC UFPR/Copel, C.P. 19067, 81531-970, Curitiba PR
dc.description.affiliationDepartamento de Engenharia Elétrica Universidade Federal do Paraná - UFPR, C.P. 19047, 81931-990, Curitiba PR
dc.description.affiliationCentro Federal de Educação Tecnológica CEFET, Cuiabá - MT
dc.description.affiliationFaculdade de Ciência e Tecnologia Universidade Estadual Paulista- UNESP, 19060-900, Presidente Prudente SP
dc.description.affiliationUnespFaculdade de Ciência e Tecnologia Universidade Estadual Paulista- UNESP, 19060-900, Presidente Prudente SP
dc.format.extent254-257
dc.identifierhttp://dx.doi.org/10.1109/ISE.2005.1612369
dc.identifier.citationProceedings - International Symposium on Electrets, v. 2005, p. 254-257.
dc.identifier.doi10.1109/ISE.2005.1612369
dc.identifier.scopus2-s2.0-33847730579
dc.identifier.urihttp://hdl.handle.net/11449/68532
dc.language.isoeng
dc.relation.ispartofProceedings - International Symposium on Electrets
dc.rights.accessRightsAcesso aberto
dc.sourceScopus
dc.subjectDielectric properties
dc.subjectElectric conductivity
dc.subjectElectric insulation
dc.subjectStress relaxation
dc.subjectThermal stress
dc.subjectDielectric behavior
dc.subjectInsulating layers
dc.subjectMulti stressing conditions
dc.subjectRoom temperature
dc.subjectElectric cables
dc.titleDielectric behavior of XLPE aged under multi-stressing conditionsen
dc.typeTrabalho apresentado em evento
dcterms.licensehttp://www.ieee.org/publications_standards/publications/rights/rights_policies.html
unesp.campusUniversidade Estadual Paulista (Unesp), Faculdade de Ciências e Tecnologia, Presidente Prudentept

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