Electric measurements with constant current: A practical method for characterizing dielectric films

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dc.contributor.authorGiacometti, J. A.
dc.contributor.authorWisniewski, C.
dc.contributor.authorRibeiro, P. A.
dc.contributor.authorMoura, W. A.
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionUniversidade de São Paulo (USP)
dc.contributor.institutionUniv Nova Lisboa
dc.date.accessioned2014-05-20T15:21:25Z
dc.date.available2014-05-20T15:21:25Z
dc.date.issued2001-11-01
dc.description.abstractThis article assesses the use of the constant current (CC) method for characterizing dielectric films. The method is based on charging the sample with a constant current (current stress) and measuring the corresponding voltage rise under the closed circuit condition. Our article shows that the CC method is an alternative to the constant voltage stressing method to study the electric properties of nonpolar, ferroelectric, and polar polymers. The method was tested by determining the dielectric constant of polytetrafluoroethylene, and investigating the electric conduction in poly(ethylene terephthalate). For the ferroelectric polymer poly(vinylidene fluoride), it is shown that hysteresis loops and the dependence of the ferroelectric polarization on the electric field can be obtained. (C) 2001 American Institute of Physics.en
dc.description.affiliationUniv Estadual Paulista, Fac Ciências & Tecnol, BR-10060900 Presidente Prudente, SP, Brazil
dc.description.affiliationUniv São Paulo, Inst Fis Sao Carlos, BR-13566970 Sao Carlos, SP, Brazil
dc.description.affiliationUniv Nova Lisboa, Fac Ciências & Tecnol, Dept Fis, CeFITec, P-2825114 Caparica, Portugal
dc.description.affiliationUnespUniv Estadual Paulista, Fac Ciências & Tecnol, BR-10060900 Presidente Prudente, SP, Brazil
dc.format.extent4223-4227
dc.identifierhttp://dx.doi.org/10.1063/1.1409564
dc.identifier.citationReview of Scientific Instruments. Melville: Amer Inst Physics, v. 72, n. 11, p. 4223-4227, 2001.
dc.identifier.doi10.1063/1.1409564
dc.identifier.fileWOS000171797000028.pdf
dc.identifier.issn0034-6748
dc.identifier.urihttp://hdl.handle.net/11449/32563
dc.identifier.wosWOS:000171797000028
dc.language.isoeng
dc.publisherAmerican Institute of Physics (AIP)
dc.relation.ispartofReview of Scientific Instruments
dc.relation.ispartofjcr1.428
dc.relation.ispartofsjr0,585
dc.rights.accessRightsAcesso restrito
dc.sourceWeb of Science
dc.titleElectric measurements with constant current: A practical method for characterizing dielectric filmsen
dc.typeArtigo
dcterms.licensehttp://publishing.aip.org/authors/web-posting-guidelines
dcterms.rightsHolderAmer Inst Physics

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