New imaging algorithm for material damage localisation based on impedance measurements under noise influence

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dc.contributor.authorde Castro, Bruno Albuquerque [UNESP]
dc.contributor.authorBaptista, Fabricio Guimarães [UNESP]
dc.contributor.authorCiampa, Francesco
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionUniversity of Surrey
dc.date.accessioned2020-12-12T02:08:23Z
dc.date.available2020-12-12T02:08:23Z
dc.date.issued2020-10-15
dc.description.abstractThe electro-mechanical impedance (EMI) measurements have been extensively studied in recent years to provide a reliable diagnosis of aerospace infrastructures. Existing imaging algorithms for EMI-based damage localisation have been proposed for controlled inspection environments or under the sole influence of temperature variations. However, the presence of signal noise may alter impedance signals and limit the use of the EMI method in real operating scenarios. Based on this issue, this short communication proposes a novel EMI probabilistic imaging algorithm for damage localisation under noisy inspections. Furthermore, as another advantage compared to traditional techniques, which do not perform a noise compensation, the proposed application does not require high computational cost since it does not require licensed software or the calculation of acoustic parameters. Experimental results on an aluminium plate-like structure revealed that the new algorithm proved to be adequate to image the location of damage under noise influence as opposed to traditional approaches.en
dc.description.affiliationSão Paulo State University (UNESP) School of Engineering Bauru Department of Electrical Engineering
dc.description.affiliationUniversity of Surrey Department of Mechanical Engineering Sciences
dc.description.affiliationUnespSão Paulo State University (UNESP) School of Engineering Bauru Department of Electrical Engineering
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.description.sponsorshipIdFAPESP: 2015/24903-5
dc.description.sponsorshipIdFAPESP: 2018/23737-2
dc.identifierhttp://dx.doi.org/10.1016/j.measurement.2020.107953
dc.identifier.citationMeasurement: Journal of the International Measurement Confederation, v. 163.
dc.identifier.doi10.1016/j.measurement.2020.107953
dc.identifier.issn0263-2241
dc.identifier.lattes2426330204919814
dc.identifier.orcid0000-0002-1200-4354
dc.identifier.scopus2-s2.0-85085257093
dc.identifier.urihttp://hdl.handle.net/11449/200504
dc.language.isoeng
dc.relation.ispartofMeasurement: Journal of the International Measurement Confederation
dc.sourceScopus
dc.subjectCCSD
dc.subjectDamage localisation
dc.subjectImaging algorithm
dc.subjectImpedance measurements
dc.subjectProbabilistic image
dc.subjectSHM
dc.subjectSignal processing
dc.titleNew imaging algorithm for material damage localisation based on impedance measurements under noise influenceen
dc.typeArtigo
unesp.author.lattes2426330204919814[2]
unesp.author.orcid0000-0002-1200-4354[2]

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Artigos - Engenharia Elétrica - FEB