The self-polarization effect in Pb(Zr0.50Ti0.50)O-3 thin films with no preferential orientation

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dc.contributor.authorLima, E. C. [UNESP]
dc.contributor.authorAraujo, E. B. [UNESP]
dc.contributor.authorBdikin, I. K.
dc.contributor.authorKholkin, A. L.
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionUniv Aveiro
dc.date.accessioned2014-05-20T13:29:46Z
dc.date.available2014-05-20T13:29:46Z
dc.date.issued2012-11-01
dc.description.abstractThis work demonstrates the existence of a self-polarization effect in Pb(Zr0.50Ti0.50)O-3 thin films with no preferential orientation. Piezoresponse Force Microscopy (PFM) and dielectric measurements were used to study the origin of this effect. The presence of only one peak shifting slightly to the negative side in the piezoresponse histogram indicates the existence of a self-polarization effect in the studied films. An increase in self-polarization was observed when the film thickness increases from 200 nm to 710 nm. The results suggest that Schottky barriers and/or mechanical coupling near the film-electrode interface are not the main mechanisms responsible for the self-polarization effect in the studied films. (c) 2012 Elsevier Ltd. All rights reserved.en
dc.description.affiliationUNESP Univ Estadual Paulista, Dept Fis & Quim, Fac Engn Ilha Solteira, BR-15385000 Ilha Solteira, SP, Brazil
dc.description.affiliationUniv Aveiro, Dept Mech Engn, P-3810193 Aveiro, Portugal
dc.description.affiliationUniv Aveiro, TEMA, P-3810193 Aveiro, Portugal
dc.description.affiliationUniv Aveiro, Dept Mat & Ceram, P-3810193 Aveiro, Portugal
dc.description.affiliationUniv Aveiro, CICECO, P-3810193 Aveiro, Portugal
dc.description.affiliationUnespUNESP Univ Estadual Paulista, Dept Fis & Quim, Fac Engn Ilha Solteira, BR-15385000 Ilha Solteira, SP, Brazil
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.description.sponsorshipCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
dc.description.sponsorshipIdFAPESP: 07/08534-3
dc.description.sponsorshipIdFAPESP: 10/16504-0
dc.description.sponsorshipIdCNPq: 307607/2009-7
dc.description.sponsorshipIdCAPES: 23038.028109 2009-26
dc.format.extent3548-3551
dc.identifierhttp://dx.doi.org/10.1016/j.materresbull.2012.06.058
dc.identifier.citationMaterials Research Bulletin. Oxford: Pergamon-Elsevier B.V. Ltd, v. 47, n. 11, p. 3548-3551, 2012.
dc.identifier.doi10.1016/j.materresbull.2012.06.058
dc.identifier.issn0025-5408
dc.identifier.lattes6725982228402054
dc.identifier.urihttp://hdl.handle.net/11449/10068
dc.identifier.wosWOS:000311865200078
dc.language.isoeng
dc.publisherPergamon-Elsevier B.V. Ltd
dc.relation.ispartofMaterials Research Bulletin
dc.relation.ispartofjcr2.873
dc.relation.ispartofsjr0,746
dc.rights.accessRightsAcesso restrito
dc.sourceWeb of Science
dc.subjectThin filmsen
dc.subjectAtomic force microscopyen
dc.subjectDielectric propertiesen
dc.titleThe self-polarization effect in Pb(Zr0.50Ti0.50)O-3 thin films with no preferential orientationen
dc.typeArtigo
dcterms.licensehttp://www.elsevier.com/about/open-access/open-access-policies/article-posting-policy
dcterms.rightsHolderPergamon-Elsevier B.V. Ltd
unesp.author.lattes6725982228402054
unesp.campusUniversidade Estadual Paulista (Unesp), Faculdade de Engenharia, Ilha Solteirapt

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Artigos - Física e Química - FEIS