Interferometric measurements of nanometric displacements in a Piezoelectric Flextensional Actuator by using the new J1...J5 method
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Undergraduate course
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IEEE
Institute of Electrical and Electronics Engineers (IEEE)
Institute of Electrical and Electronics Engineers (IEEE)
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Abstract
In this work, nanometric displacement amplitudes of a Piezoelectric Flextensional Actuator (PFA) designed using the topology optimization technique and operating in its linear range are measured by using a homodyne Michelson interferometer. A new improved version of the J1...J4 method for optical phase measurements, named J1...J5 method, is presented, which is of easier implementation than the original one. This is a passive phase detection scheme, unaffected by signal fading, source instabilities and changes in visibility. Experimental results using this improvement were compared with those obtained by using the J1... J4, J1...J6(pos) and J1...J 6(neg) methods, concluding that the dynamic range is increased while maintaining the sensitivity. Analysis based on the 1/f voltage noise and random fading show the new method is more stable to phase drift than all those methods. © 2012 IEEE.
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Keywords
Dynamic range , Flextensional actuator , Homodynes , Interferometric measurement , Linear range , Nanometric displacements , Optimization techniques , Passive phase , Phase drift , Signal fading , Voltage noise , Actuators , Industrial applications , Michelson interferometers , Sensitivity analysis , Piezoelectricity
Language
English
Citation
2012 10th IEEE/ias International Conference on Industry Applications (induscon). New York: IEEE, p. 6, 2012.
