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Correction to: A novel impedimetric sensor for trace level detection of dimethyl sulfide (DMS)

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dc.contributor.authorIden, Hassan
dc.contributor.authorde Faria, Ricardo Adriano Dorledo
dc.contributor.authorHeneine, Luiz Guilherme Dias
dc.contributor.authorMatencio, Tulio
dc.contributor.authorMessaddeq, Younès [UNESP]
dc.contributor.institutionUniversité Laval
dc.contributor.institutionCDN Isotopes
dc.contributor.institutionUniversidade Federal de Minas Gerais (UFMG)
dc.contributor.institutionFundação Ezequiel Dias (FUNED)
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2020-12-12T02:48:05Z
dc.date.available2020-12-12T02:48:05Z
dc.date.issued2020-09-01
dc.description.abstractThe original version of this paper was unfortunately published with some errors which are corrected by publishing this Correction article.en
dc.description.affiliationCenter for Optics Photonics and Lasers (COPL) Université Laval
dc.description.affiliationCDN Isotopes
dc.description.affiliationDepartment of Chemical Engineering Universidade Federal de Minas Gerais (UFMG)
dc.description.affiliationLaboratory of Applied Immunology Fundação Ezequiel Dias (FUNED)
dc.description.affiliationDepartment of Chemistry Universidade Federal de Minas Gerais (UFMG)
dc.description.affiliationInstitute of Chemistry UNESP
dc.description.affiliationUnespInstitute of Chemistry UNESP
dc.format.extent16087
dc.identifierhttp://dx.doi.org/10.1007/s10854-020-04197-7
dc.identifier.citationJournal of Materials Science: Materials in Electronics, v. 31, n. 18, p. 16087-, 2020.
dc.identifier.doi10.1007/s10854-020-04197-7
dc.identifier.issn1573-482X
dc.identifier.issn0957-4522
dc.identifier.scopus2-s2.0-85089597420
dc.identifier.urihttp://hdl.handle.net/11449/202033
dc.language.isoeng
dc.relation.ispartofJournal of Materials Science: Materials in Electronics
dc.sourceScopus
dc.titleCorrection to: A novel impedimetric sensor for trace level detection of dimethyl sulfide (DMS)en
dc.title.alternativeCorrection to: A novel impedimetric sensor for trace level detection of dimethyl sulfide (DMS) (Journal of Materials Science: Materials in Electronics, (2020), 31, 13, (10398-10407), 10.1007/s10854-020-03588-0)en
dc.typeErrata
dspace.entity.typePublication
unesp.author.orcid0000-0002-7025-7042[2]
unesp.campusUniversidade Estadual Paulista (UNESP), Instituto de Química, Araraquarapt
unesp.departmentQuímica Inorgânica - IQARpt

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Araraquara - IQAR - Instituto de Química