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Measurement of orthovoltage X-ray intensity with a lithium niobate transducer

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dc.contributor.authorPontes, Wesley [UNESP]
dc.contributor.authorDe Carvalho, Aparecido Augusto [UNESP]
dc.contributor.authorSanches, Marcelo Augusto Assunção [UNESP]
dc.contributor.authorDe Freitas, Ricardo Luiz Barros [UNESP]
dc.contributor.authorDe Paula, Mauro Henrique
dc.contributor.authorSakamoto, Walter Katsumi [UNESP]
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionFederal University of Mato Grosso Do Sul
dc.date.accessioned2014-05-27T11:24:03Z
dc.date.available2014-05-27T11:24:03Z
dc.date.issued2009-12-01
dc.description.abstractA microcontrolled instrument for measuring the energy fluence rate (or intensity) of X-ray pulses in the orthovoltage range of 120 to 300 kV is described. The prototype instrument consists of a pyroelectric sensor, a low-noise highsensitivity current-to-voltage converter, a microcontroller and a digital display. The response of the instrument is nonlinear with the intensity of the radiation. The precision is better than 3%. The equipment is inexpensive, rugged, simple to construct and has good long-term stability. © 2009 Springer-Verlag.en
dc.description.affiliationDepartment of Electrical Engineering São Paulo State University - UNESP, Avenida Brasil, 56, Ilha Solteira
dc.description.affiliationPhysics Department Federal University of Mato Grosso Do Sul, Campo Grande, MS 79070-900
dc.description.affiliationDepto. Physics and Chemistry São Paulo State University - UNESP, Ilha Solteira, SP 15385-000
dc.description.affiliationUnespDepartment of Electrical Engineering São Paulo State University - UNESP, Avenida Brasil, 56, Ilha Solteira
dc.description.affiliationUnespDepto. Physics and Chemistry São Paulo State University - UNESP, Ilha Solteira, SP 15385-000
dc.format.extent667-670
dc.identifierhttp://dx.doi.org/10.1007/978-3-642-03902-7-192
dc.identifier.citationIFMBE Proceedings, v. 25, n. 3, p. 667-670, 2009.
dc.identifier.doi10.1007/978-3-642-03902-7-192
dc.identifier.issn1680-0737
dc.identifier.lattes0250066159980825
dc.identifier.lattes0896348165708140
dc.identifier.lattes8630973561889272
dc.identifier.scopus2-s2.0-77950124310
dc.identifier.urihttp://hdl.handle.net/11449/71267
dc.language.isoeng
dc.relation.ispartofIFMBE Proceedings
dc.relation.ispartofsjr0,143
dc.rights.accessRightsAcesso aberto
dc.sourceScopus
dc.subjectEnergy fluence rate
dc.subjectMicrocontrolled instrument
dc.subjectOrthovoltage range
dc.subjectPyroelectric sensor
dc.subjectX-ray intensity
dc.subjectEnergy fluences
dc.subjectOrthovoltage
dc.subjectPyroelectric sensors
dc.subjectX ray intensity
dc.subjectBiomedical engineering
dc.subjectDosimetry
dc.subjectInstruments
dc.subjectLithium
dc.subjectNiobium compounds
dc.subjectPhysics
dc.subjectRadiation shielding
dc.subjectSensors
dc.subjectX rays
dc.subjectBiological radiation effects
dc.titleMeasurement of orthovoltage X-ray intensity with a lithium niobate transduceren
dc.typeTrabalho apresentado em evento
dcterms.licensehttp://www.springer.com/open+access/authors+rights
dspace.entity.typePublication
unesp.author.lattes0250066159980825[2]
unesp.author.lattes0896348165708140
unesp.author.lattes8630973561889272
unesp.author.orcid0000-0001-8204-3482[2]
unesp.campusUniversidade Estadual Paulista (UNESP), Faculdade de Engenharia, Ilha Solteirapt
unesp.departmentEngenharia Elétrica - FEISpt
unesp.departmentFísica e Química - FEISpt

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Ilha Solteira - FEIS - Faculdade de Engenharia