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CaCu3Ti4O12 thin films with non-linear resistivity deposited by RF-sputtering

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dc.contributor.authorFoschini, C. R. [UNESP]
dc.contributor.authorTararam, R. [UNESP]
dc.contributor.authorSimões, A. Z. [UNESP]
dc.contributor.authorCilense, M. [UNESP]
dc.contributor.authorLongo, Elson [UNESP]
dc.contributor.authorVarela, José Arana [UNESP]
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-27T11:29:57Z
dc.date.available2014-05-27T11:29:57Z
dc.date.issued2013-07-11
dc.description.abstractCalcium copper titanate, CaCu3Ti4O12, CCTO, thin films with polycrystalline nature have been deposited by RF sputtering on Pt/Ti/SiO2/Si (100) substrates at a room temperature followed by annealing at 600 °C for 2 h in a conventional furnace. The CCTO thin film present a cubic structure with lattice parameter a = 7.379 ±0.001 Å free of secondary phases. The observed electrical features of CCTO thin films are highly dependent on the [CaO12], [CaO 4], [CuO11], [CuO11Vx 0] and [TiO5.VO] clusters. The CCTO film capacitor showed a dielectric loss of 0.40 and a dielectric permittivity of 70 at 1 kHz. The J-V behavior is completely symmetrical, regardless of whether the conduction is limited by interfacial barriers or by bulk-like mechanisms. © 2013 Elsevier B.V. All rights reserved.en
dc.description.affiliationUniversidade Estadual Paulista - UNESP Faculdade de Engenharia de Bauru Dept. de Eng. Mecânica, Av. Eng. Luiz Edmundo C. Coube 14-01, CEP 17033-360 Bauru, SP
dc.description.affiliationUniversidade Estadual Paulista - UNESP Instituto de Química, Rua Prof. Francisco Degni no. 55, CEP 14800-900 Araraquara, SP
dc.description.affiliationUniversidade Estadual Paulista - UNESP Faculdade de Engenharia de Guaratinguetá, Av. Dr. Ariberto Pereira da Cunha, no. 333, CEP 12516-410 Guaratinguetá, SP
dc.description.affiliationUnespUniversidade Estadual Paulista - UNESP Faculdade de Engenharia de Bauru Dept. de Eng. Mecânica, Av. Eng. Luiz Edmundo C. Coube 14-01, CEP 17033-360 Bauru, SP
dc.description.affiliationUnespUniversidade Estadual Paulista - UNESP Instituto de Química, Rua Prof. Francisco Degni no. 55, CEP 14800-900 Araraquara, SP
dc.description.affiliationUnespUniversidade Estadual Paulista - UNESP Faculdade de Engenharia de Guaratinguetá, Av. Dr. Ariberto Pereira da Cunha, no. 333, CEP 12516-410 Guaratinguetá, SP
dc.format.extent604-608
dc.identifierhttp://dx.doi.org/10.1016/j.jallcom.2013.05.216
dc.identifier.citationJournal of Alloys and Compounds, v. 574, p. 604-608.
dc.identifier.doi10.1016/j.jallcom.2013.05.216
dc.identifier.issn0925-8388
dc.identifier.lattes1922357184842767
dc.identifier.orcid0000-0003-1300-4978
dc.identifier.scopus2-s2.0-84879825033
dc.identifier.urihttp://hdl.handle.net/11449/75949
dc.identifier.wosWOS:000321749600097
dc.language.isoeng
dc.relation.ispartofJournal of Alloys and Compounds
dc.relation.ispartofjcr3.779
dc.relation.ispartofsjr1,020
dc.rights.accessRightsAcesso restrito
dc.sourceScopus
dc.subjectChemical synthesis
dc.subjectElectron microscopy
dc.subjectThin films
dc.subjectX-ray diffraction
dc.subjectCalcium copper titanates
dc.subjectConventional furnace
dc.subjectCubic structure
dc.subjectDielectric permittivities
dc.subjectInterfacial barriers
dc.subjectPolycrystalline
dc.subjectRoom temperature
dc.subjectSecondary phasis
dc.subjectDielectric losses
dc.subjectPermittivity
dc.subjectSynthesis (chemical)
dc.subjectX ray diffraction
dc.titleCaCu3Ti4O12 thin films with non-linear resistivity deposited by RF-sputteringen
dc.typeArtigo
dcterms.licensehttp://www.elsevier.com/about/open-access/open-access-policies/article-posting-policy
dspace.entity.typePublication
unesp.author.lattes1922357184842767[1]
unesp.author.orcid0000-0003-1300-4978[1]
unesp.campusUniversidade Estadual Paulista (UNESP), Faculdade de Engenharia, Baurupt
unesp.departmentEngenharia Mecânica - FEBpt

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Bauru - FEB - Faculdade de Engenharia