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Synthesis and characterization of CaBi4Ti4O15 thin films annealed by microwave and conventional furnaces

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dc.contributor.authorSimoes, A. Z.
dc.contributor.authorRiccardi, C. S.
dc.contributor.authorRamirez, M. A.
dc.contributor.authorCavalcante, L. S.
dc.contributor.authorLongo, Elson [UNESP]
dc.contributor.authorVarela, José Arana [UNESP]
dc.contributor.institutionUniversidade Federal de São Carlos (UFSCar)
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-20T14:17:56Z
dc.date.available2014-05-20T14:17:56Z
dc.date.issued2007-08-01
dc.description.abstractCaBi4Ti4O15 thin films were deposited by the polymeric precursor method and crystallized in a domestic microwave oven and conventional furnace. The films obtained for microwave energy are well-adhered, homogeneous and with good specularity, when treated at 700 degrees C for 10 min. The microstructure and the structure of the films can be tuned by adjusting the crystallization conditions. When microwave oven is employed, the films presented bigger grains with mean grain size around 80 nm. For comparison, films were also prepared by the conventional furnace at 700 degrees C for 2 h. (C) 2007 Elsevier Masson SAS. All rights reserved.en
dc.description.affiliationUniv Fed Sao Carlos, Dept Quim, Lab Interdisciplinar Electroquim & Ceram, BR-13565905 Sao Carlos, SP, Brazil
dc.description.affiliationUniv Estadual Paulista, Inst Quim, Dept Quim Fis, Lab Interdisciplinar Ceram, Araraquara, SP, Brazil
dc.description.affiliationUnespUniv Estadual Paulista, Inst Quim, Dept Quim Fis, Lab Interdisciplinar Ceram, Araraquara, SP, Brazil
dc.format.extent756-760
dc.identifierhttp://dx.doi.org/10.1016/j.solidstatesciences.2007.05.003
dc.identifier.citationSolid State Sciences. Amsterdam: Elsevier B.V., v. 9, n. 8, p. 756-760, 2007.
dc.identifier.doi10.1016/j.solidstatesciences.2007.05.003
dc.identifier.issn1293-2558
dc.identifier.urihttp://hdl.handle.net/11449/25383
dc.identifier.wosWOS:000249522400017
dc.language.isoeng
dc.publisherElsevier B.V.
dc.relation.ispartofSolid State Sciences
dc.relation.ispartofjcr1.861
dc.relation.ispartofsjr0,574
dc.rights.accessRightsAcesso restrito
dc.sourceWeb of Science
dc.subjectbismuth layerpt
dc.subjectcrystallizationpt
dc.subjectmicrowave ovenpt
dc.subjectferroelectric propertiespt
dc.titleSynthesis and characterization of CaBi4Ti4O15 thin films annealed by microwave and conventional furnacesen
dc.typeArtigo
dcterms.licensehttp://www.elsevier.com/about/open-access/open-access-policies/article-posting-policy
dcterms.rightsHolderElsevier B.V.
dspace.entity.typePublication
unesp.author.lattes3573363486614904[1]
unesp.author.lattes0173401604473200[2]
unesp.author.orcid0000-0003-2535-2187[1]
unesp.author.orcid0000-0003-2192-5312[2]
unesp.campusUniversidade Estadual Paulista (UNESP), Instituto de Química, Araraquarapt
unesp.departmentFísico-Química - IQARpt

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Araraquara - IQAR - Instituto de Química