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dc.contributor.authorBasso Bernardi, Maria Ines
dc.contributor.authorQueiroz Maia, Lauro June
dc.contributor.authorAntonelli, Eduardo
dc.contributor.authorMesquita, Alexandre [UNESP]
dc.contributor.authorLi, Maximo Siu
dc.contributor.authorGama, Lucianna
dc.date.accessioned2014-12-03T13:08:47Z
dc.date.available2014-12-03T13:08:47Z
dc.date.issued2014-03-01
dc.identifierhttp://dx.doi.org/10.1051/epjap/2014130225
dc.identifier.citationEuropean Physical Journal-applied Physics. Les Ulis Cedex A: Edp Sciences S A, v. 65, n. 3, 8 p., 2014.
dc.identifier.issn1286-0042
dc.identifier.urihttp://hdl.handle.net/11449/111582
dc.description.abstractNanometric Zn1-xCoxO ( x = 0.020, 0.025 and 0.030 in mol.%) nanopowders were obtained from low temperature calcination of a resin prepared using the Pechini's method. Firing the Zn1-xCoxO resin at 400 degrees C/2 h a powder with hexagonal structure was obtained as measured by X-ray diffraction (XRD). The powder presented average particle size of 40 nm observed by field emission scanning electronic microscopy (FE-SEM) micrographs and average crystallite size of 10 nm calculated from the XRD using Scherrer's equation. Nanocrystalline Zn1-xCoxO films with good homogeneity and optical quality were obtained with 280-980 nm thicknesses by electron beam physical vapour deposition (EBPVD) under vacuum onto silica substrate at 25 degrees C. Scanning electron microscopy with field emission gun showed that the film microstructure is composed by spherical grains and some needles. In these conditions of deposition the films presented only hexagonal phase observed by XRD. The UV-visible-NIR and diffuse reflectance properties of the films were measured and the electric properties were calculated using the reflectance and transmittance spectra.en
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.description.sponsorshipCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.format.extent8
dc.language.isoeng
dc.publisherEdp Sciences S A
dc.relation.ispartofEuropean Physical Journal-applied Physics
dc.sourceWeb of Science
dc.titleCoO doping effects on the ZnO films through EBPDV techniqueen
dc.typeArtigo
dcterms.rightsHolderEdp Sciences S A
dc.contributor.institutionUniversidade de São Paulo (USP)
dc.contributor.institutionUniversidade Federal de Goiás (UFG)
dc.contributor.institutionUniversidade Federal de São Paulo (UNIFESP)
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionUniversidade Federal de Campina Grande (UFCG)
dc.description.affiliationUniv Sao Paulo, Inst Fis Sao Carlos, BR-13560970 Sao Carlos, SP, Brazil
dc.description.affiliationUniv Fed Goias, Inst Fis, BR-74001970 Goiania, Go, Brazil
dc.description.affiliationUniv Fed Sao Paulo, Inst Ciencia & Tecnol, BR-12231280 Sao Jose Dos Campos, SP, Brazil
dc.description.affiliationUniv Estadual Paulista, Inst Geociencias & Ciencias Exatas, BR-13506900 Rio Claro, SP, Brazil
dc.description.affiliationUniv Fed Campina Grande, Dept Engn Mat, BR-58109970 Campina Grande, PB, Brazil
dc.description.affiliationUnespUniv Estadual Paulista, Inst Geociencias & Ciencias Exatas, BR-13506900 Rio Claro, SP, Brazil
dc.identifier.doi10.1051/epjap/2014130225
dc.identifier.wosWOS:000333668000005
dc.rights.accessRightsAcesso restrito
unesp.campusUniversidade Estadual Paulista (Unesp), Instituto de Geociências e Ciências Exatas, Rio Claropt
dc.identifier.fileWOS000333668000005.pdf
unesp.author.lattes2835864951583089[4]
unesp.author.orcid0000-0001-7277-4126[5]
unesp.author.orcid0000-0001-5029-1115[3]
unesp.author.orcid0000-0002-9913-4716[2]
unesp.author.orcid0000-0001-8524-0959[4]
dc.relation.ispartofjcr0.802
dc.relation.ispartofsjr0,261
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