Impedance spectroscopy analysis of SnO2 thick-films gas sensors

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dc.contributor.authorPonce, M. A.
dc.contributor.authorBueno, Paulo Roberto [UNESP]
dc.contributor.authorVarela, José Arana [UNESP]
dc.contributor.authorCastro, M. S.
dc.contributor.authorAldao, C. M.
dc.contributor.institutionUniv Nacl Mar Plata
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-20T14:18:36Z
dc.date.available2014-05-20T14:18:36Z
dc.date.issued2008-12-01
dc.description.abstractA careful analysis of the impedance response of SnO2 thick films under vacuum and air atmosphere is reported in the present work. The AC electrical resistance was analyzed and it was shown that it is highly frequency dependent. Different models and its equivalent circuit representation were proposed and carefully analyzed based on the microstructure features of the device. Basically, an interpretation of the frequency dependent resistance was proposed based on the fact that different grains characteristics and junctions exist. These different grains and junctions are the main source of resistance dependent feature. An equivalent circuit model, considering different grain sizes associated with different grain boundary junctions characteristics, was introduced so that a consistent interpretation of the results was possible.en
dc.description.affiliationUniv Nacl Mar Plata, CONICET, Inst Mat Sci & Technol INTEMA, Mar Del Plata, Buenos Aires, Argentina
dc.description.affiliationUniv Estadual Paulista, Inst Quim, Dept Quim Fis, BR-14800900 Araraquara, SP, Brazil
dc.description.affiliationUnespUniv Estadual Paulista, Inst Quim, Dept Quim Fis, BR-14800900 Araraquara, SP, Brazil
dc.format.extent1169-1175
dc.identifierhttp://dx.doi.org/10.1007/s10854-007-9517-9
dc.identifier.citationJournal of Materials Science-materials In Electronics. Dordrecht: Springer, v. 19, n. 12, p. 1169-1175, 2008.
dc.identifier.doi10.1007/s10854-007-9517-9
dc.identifier.issn0957-4522
dc.identifier.lattes0477045906733254
dc.identifier.orcid0000-0003-2827-0208
dc.identifier.urihttp://hdl.handle.net/11449/25610
dc.identifier.wosWOS:000260191000005
dc.language.isoeng
dc.publisherSpringer
dc.relation.ispartofJournal of Materials Science: Materials in Electronics
dc.relation.ispartofjcr2.324
dc.relation.ispartofsjr0,503
dc.rights.accessRightsAcesso restrito
dc.sourceWeb of Science
dc.titleImpedance spectroscopy analysis of SnO2 thick-films gas sensorsen
dc.typeArtigo
dcterms.licensehttp://www.springer.com/open+access/authors+rights?SGWID=0-176704-12-683201-0
dcterms.rightsHolderSpringer
unesp.author.lattes0477045906733254[2]
unesp.author.orcid0000-0003-2827-0208[2]
unesp.campusUniversidade Estadual Paulista (Unesp), Instituto de Química, Araraquarapt

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Artigos - Físico Química - IQ