Planning accelerated life tests under Exponentiated-Weibull-Arrhenius model

Página do item simplificado
dc.contributor.authorBarriga, Gladys D.C. [UNESP]
dc.contributor.authorHo, Linda Lee
dc.contributor.authorCancho, Vicente G.
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionUniversidade de São Paulo (USP)
dc.date.accessioned2014-05-27T11:23:36Z
dc.date.available2014-05-27T11:23:36Z
dc.date.issued2008-07-08
dc.description.abstractPurpose - The purpose of this paper is to present designs for an accelerated life test (ALT). Design/methodology/approach - Bayesian methods and simulation Monte Carlo Markov Chain (MCMC) methods were used. Findings - In the paper a Bayesian method based on MCMC for ALT under EW distribution (for life time) and Arrhenius models (relating the stress variable and parameters) was proposed. The paper can conclude that it is a reasonable alternative to the classical statistical methods since the implementation of the proposed method is simple, not requiring advanced computational understanding and inferences on the parameters can be made easily. By the predictive density of a future observation, a procedure was developed to plan ALT and also to verify if the conformance fraction of the manufactured process reaches some desired level of quality. This procedure is useful for statistical process control in many industrial applications. Research limitations/implications - The results may be applied in a semiconductor manufacturer. Originality/value - The Exponentiated-Weibull-Arrhenius model has never before been used to plan an ALT. © Emerald Group Publishing Limited.en
dc.description.affiliationFaculdade de Ciências e Letras de Araraquara UNESP, Araraquara
dc.description.affiliationEP Universidade de São Paulo, São Paulo
dc.description.affiliationICMC Universidade de São Paulo, São Paulo
dc.description.affiliationUnespFaculdade de Ciências e Letras de Araraquara UNESP, Araraquara
dc.format.extent636-653
dc.identifierhttp://dx.doi.org/10.1108/02656710810881926
dc.identifier.citationInternational Journal of Quality and Reliability Management, v. 25, n. 6, p. 636-653, 2008.
dc.identifier.doi10.1108/02656710810881926
dc.identifier.issn0265-671X
dc.identifier.scopus2-s2.0-46249125874
dc.identifier.urihttp://hdl.handle.net/11449/70475
dc.language.isoeng
dc.relation.ispartofInternational Journal of Quality and Reliability Management
dc.rights.accessRightsAcesso restrito
dc.sourceScopus
dc.subjectMonte Carlo methods
dc.subjectProduction processes
dc.subjectSemiconductors
dc.titlePlanning accelerated life tests under Exponentiated-Weibull-Arrhenius modelen
dc.typeArtigo
dcterms.licensehttp://www.emeraldinsight.com/authors/writing/author_rights.htm
unesp.campusUniversidade Estadual Paulista (Unesp), Faculdade de Engenharia, Baurupt
unesp.departmentEngenharia de Produção - FEBpt

Arquivos

Coleções

Bauru - FEB - Faculdade de Engenharia