The use of elevation map histograms for topographic heterogeneity analysis

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dc.contributor.authorMota, Rogério Pinto [UNESP]
dc.contributor.authorDe Campos, Elson
dc.contributor.authorMarins, Eleasar M.
dc.contributor.authorLucena, Emerson F.
dc.contributor.authorMelo, Francisco C. L.
dc.contributor.authorAlgatti, Mauricio A. [UNESP]
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionEEAR/COMAER
dc.contributor.institutionAMR/IAE/CTA
dc.date.accessioned2014-05-27T11:29:48Z
dc.date.available2014-05-27T11:29:48Z
dc.date.issued2013-07-01
dc.description.abstractSurface defects are extremely important in mechanical characterization of several different materials. Therefore, the analysis of surface finishing is essential for a further simulation of surface mechanical properties in a customized project in materials science and technology. One of the methods commonly employed for such purpose is the statistical mapping of different sample surface regions using the depth from focus technique. The analysis is usually performed directly from the elevation maps which are obtained from the digital image processing. In this paper, the possibility of quantifying the surface heterogeneity of Silicon Carbide porous ceramics by elevation map histograms is presented. The advantage of this technique is that it allows the qualitative or quantitative verification of all surface image fields that cannot be done by using the Surface Plot plugin of image J™ platform commonly used in digital image processing. © 2012 Springer Science+Business Media, LLC.en
dc.description.affiliationDepartamento de Fisica e Química UNESP - Guaratinguetá, São Paulo
dc.description.affiliationEEAR/COMAER, Guaratinguetá São Paulo
dc.description.affiliationAMR/IAE/CTA, São José dos Campos São Paulo
dc.description.affiliationUnespDepartamento de Fisica e Química UNESP - Guaratinguetá, São Paulo
dc.format.extent2529-2531
dc.identifierhttp://dx.doi.org/10.1007/s10948-012-1699-6
dc.identifier.citationJournal of Superconductivity and Novel Magnetism, v. 26, n. 7, p. 2529-2531, 2013.
dc.identifier.doi10.1007/s10948-012-1699-6
dc.identifier.issn1557-1939
dc.identifier.issn1557-1947
dc.identifier.lattes9585258374949244
dc.identifier.scopus2-s2.0-84879124668
dc.identifier.urihttp://hdl.handle.net/11449/75745
dc.identifier.wosWOS:000323923800035
dc.language.isoeng
dc.relation.ispartofJournal of Superconductivity and Novel Magnetism
dc.relation.ispartofjcr1.142
dc.relation.ispartofsjr0,320
dc.relation.ispartofsjr0,320
dc.rights.accessRightsAcesso restrito
dc.sourceScopus
dc.subjectDepth from focus
dc.subjectElevation map
dc.subjectHistogram
dc.subjectSurface
dc.subjectElevation maps
dc.subjectMaterials science and technology
dc.subjectMechanical characterizations
dc.subjectQuantitative verification
dc.subjectSurface heterogeneities
dc.subjectSurface mechanical properties
dc.subjectCharacterization
dc.subjectGraphic methods
dc.subjectImage processing
dc.subjectMechanical properties
dc.subjectSilicon carbide
dc.subjectStatistical methods
dc.subjectSurfaces
dc.titleThe use of elevation map histograms for topographic heterogeneity analysisen
dc.typeArtigo
dcterms.licensehttp://www.springer.com/open+access/authors+rights
unesp.author.lattes9585258374949244
unesp.campusUniversidade Estadual Paulista (Unesp), Faculdade de Engenharia, Guaratinguetápt

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Artigos - Física e Química - FEG