Effect of annealing atmosphere on phase formation and electrical characteristics of bismuth ferrite thin films

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dc.contributor.authorSimões, Alexandre Zirpoli [UNESP]
dc.contributor.authorRiccardi, C. S. [UNESP]
dc.contributor.authorDos Santos, M. L. [UNESP]
dc.contributor.authorGarcia, F. Gonzalez
dc.contributor.authorLongo, Elson [UNESP]
dc.contributor.authorVarela, José Arana [UNESP]
dc.contributor.institutionUniversidade Federal de Itajubá (UNIFEI)
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-20T14:18:28Z
dc.date.available2014-05-20T14:18:28Z
dc.date.issued2009-08-05
dc.description.abstractBismuth ferrite thin films were deposited on Pt/Ti/SiO(2)/Si substrates by a soft chemical method and spin-coating technique. The effect of annealing atmosphere (air, N(2) and O(2)) on the structure and electrical properties of the films are reported. X-ray diffraction analysis reveals that the film annealed in air atmosphere is a single-phase perovskite structure. The films annealed in air showed better crystallinity and the presence of a single BFO phase leading to lower leakage current density and superior ferroelectric hysteresis loops at room temperature. In this way, we reveal that BFO film crystallized in air atmosphere by the soft chemical method can be useful for practical applications, including nonvolatile digital memories, spintronics and data-storage media. (C) 2009 Elsevier Ltd. All rights reserved.en
dc.description.affiliationUniversidade Federal de Itajubá (UNIFEI), BR-35900373 Itabira, MG, Brazil
dc.description.affiliationUniv Estadual Paulista, Inst Quim, Dept Quim Fis, Lab Interdisciplinar Ceram, BR-14800900 Araraquara, SP, Brazil
dc.description.affiliationUnespUniv Estadual Paulista, Inst Quim, Dept Quim Fis, Lab Interdisciplinar Ceram, BR-14800900 Araraquara, SP, Brazil
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.description.sponsorshipCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
dc.format.extent1747-1752
dc.identifierhttp://dx.doi.org/10.1016/j.materresbull.2009.03.011
dc.identifier.citationMaterials Research Bulletin. Oxford: Pergamon-Elsevier B.V. Ltd, v. 44, n. 8, p. 1747-1752, 2009.
dc.identifier.doi10.1016/j.materresbull.2009.03.011
dc.identifier.issn0025-5408
dc.identifier.urihttp://hdl.handle.net/11449/25561
dc.identifier.wosWOS:000267725300026
dc.language.isoeng
dc.publisherPergamon-Elsevier B.V. Ltd
dc.relation.ispartofMaterials Research Bulletin
dc.relation.ispartofjcr2.873
dc.relation.ispartofsjr0,746
dc.rights.accessRightsAcesso restrito
dc.sourceWeb of Science
dc.subjectThin filmsen
dc.subjectChemical synthesisen
dc.subjectAtomic force microscopyen
dc.subjectFerroelectricityen
dc.titleEffect of annealing atmosphere on phase formation and electrical characteristics of bismuth ferrite thin filmsen
dc.typeArtigo
dcterms.licensehttp://www.elsevier.com/about/open-access/open-access-policies/article-posting-policy
dcterms.rightsHolderPergamon-Elsevier B.V. Ltd
unesp.author.lattes0173401604473200[2]
unesp.author.orcid0000-0003-2192-5312[2]
unesp.campusUniversidade Estadual Paulista (Unesp), Instituto de Química, Araraquarapt

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