Low voltage and variable-pressure scanning electron microscopy of fractured composites

Página do item simplificado
dc.contributor.authorde Oliveira Hein, Luis Rogerio [UNESP]
dc.contributor.authorde Campos, Kamila Amato [UNESP]
dc.contributor.authorReis de Oliveira Caltabiano, Pietro Carelli [UNESP]
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-20T13:28:16Z
dc.date.available2014-05-20T13:28:16Z
dc.date.issued2012-10-01
dc.description.abstractUncoated fracture surfaces of carbon-epoxy composites are investigated using a variable-pressure environmental scanning electron microscope (VP-ESEM), under optimized conditions for topographic description, image quality and sample preservation. Always using freeware or open source programs, parameters for low-voltage and low vacuum are stipulated with the support of Monte Carlo simulations combined to topographic measurements, tailoring the VP-ESEM setup for visualization of fine relief details. Based on topographic information from atomic force microscope (AFM) images, finest fracture steps were measured. These were the references to optimize and define boundaries for applied beam voltages and chamber pressures, restricted by the beam penetration depth and gas-electron interactions, guided by Monte Carlo simulations and signal-to-noise measurements. For VP mode, ideal chamber pressure was found around 30-40 Pa at 3 keV beam voltage and 6 mm working distance. Lower pressures will cause noise due to electron charging and gas excess provokes resolution degradation and noise due to positive charging and electron beam scattering, raising the skirt radius. When a larger working distance is necessary, it can be compensated by adjusting the detector bias and the probe current, or even lowering chamber pressure, but the signal-to-noise ratio will certainly change. Monte Carlo simulations provided a good approach to optimize imaging conditions under low vacuum and low voltage for fractographic analysis of carbon-epoxy composites. (C) 2012 Elsevier Ltd. All rights reserved.en
dc.description.affiliationUNESP Univ Estadual Paulista, DMT Dept Mat & Technol, LAIMat Mat Image Anal Lab, BR-12516410 Guaratingueta, SP, Brazil
dc.description.affiliationUnespUNESP Univ Estadual Paulista, DMT Dept Mat & Technol, LAIMat Mat Image Anal Lab, BR-12516410 Guaratingueta, SP, Brazil
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.format.extent1039-1049
dc.identifierhttp://dx.doi.org/10.1016/j.micron.2012.04.012
dc.identifier.citationMicron. Oxford: Pergamon-Elsevier B.V. Ltd, v. 43, n. 10, p. 1039-1049, 2012.
dc.identifier.doi10.1016/j.micron.2012.04.012
dc.identifier.issn0968-4328
dc.identifier.urihttp://hdl.handle.net/11449/9399
dc.identifier.wosWOS:000306031400004
dc.language.isoeng
dc.publisherPergamon-Elsevier B.V. Ltd
dc.relation.ispartofMicron
dc.relation.ispartofjcr1.728
dc.relation.ispartofsjr0,624
dc.rights.accessRightsAcesso restrito
dc.sourceWeb of Science
dc.subjectMonte Carloen
dc.subjectLow voltageen
dc.subjectVariable pressure scanning electron microscopeen
dc.subjectSignal-to-noise ratioen
dc.titleLow voltage and variable-pressure scanning electron microscopy of fractured compositesen
dc.typeArtigo
dcterms.licensehttp://www.elsevier.com/about/open-access/open-access-policies/article-posting-policy
dcterms.rightsHolderPergamon-Elsevier B.V. Ltd
unesp.campusUniversidade Estadual Paulista (Unesp), Faculdade de Engenharia, Guaratinguetápt

Arquivos

Licença do Pacote
Agora exibindo 1 - 2 de 2
Nenhuma Miniatura disponível
Nome:
license.txt
Tamanho:
1.71 KB
Formato:
Item-specific license agreed upon to submission
Descrição:
Nenhuma Miniatura disponível
Nome:
license.txt
Tamanho:
1.71 KB
Formato:
Item-specific license agreed upon to submission
Descrição:

Coleções

Artigos - Materiais e Tecnologia - FEG