Correlative fractography: Combining scanning electron microscopy and light microscopes for qualitative and quantitative analysis of fracture surfaces

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dc.contributor.authorDe Oliveira Hein, Luis Rogerio. [UNESP]
dc.contributor.authorDe Oliveira, José Alberto [UNESP]
dc.contributor.authorDe Campos, Kamila Amato [UNESP]
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-27T11:28:45Z
dc.date.available2014-05-27T11:28:45Z
dc.date.issued2013-04-01
dc.description.abstractCorrelative fractography is a new expression proposed here to describe a new method for the association between scanning electron microscopy (SEM) and light microscopy (LM) for the qualitative and quantitative analysis of fracture surfaces. This article presents a new method involving the fusion of one elevation map obtained by extended depth from focus reconstruction from LM with exactly the same area by SEM and associated techniques, as X-ray mapping. The true topographic information is perfectly associated to local fracture mechanisms with this new technique, presented here as an alternative to stereo-pair reconstruction for the investigation of fractured components. The great advantage of this technique resides in the possibility of combining any imaging methods associated with LM and SEM for the same observed field from fracture surface. © Microscopy Society of America 2013.en
dc.description.affiliationUniversidade Estadual Paulista (UNESP) DMT - Department of Materials and Technology LAIMat - Materials Imaging Laboratory, Av. Ariberto Pereira da Cunha, 333, Guaratinguetá, SP, 12.516-410
dc.description.affiliationUnespUniversidade Estadual Paulista (UNESP) DMT - Department of Materials and Technology LAIMat - Materials Imaging Laboratory, Av. Ariberto Pereira da Cunha, 333, Guaratinguetá, SP, 12.516-410
dc.format.extent496-500
dc.identifierhttp://dx.doi.org/10.1017/S1431927612014249
dc.identifier.citationMicroscopy and Microanalysis, v. 19, n. 2, p. 496-500, 2013.
dc.identifier.doi10.1017/S1431927612014249
dc.identifier.file2-s2.0-84875470129.pdf
dc.identifier.issn1431-9276
dc.identifier.issn1435-8115
dc.identifier.scopus2-s2.0-84875470129
dc.identifier.urihttp://hdl.handle.net/11449/74949
dc.identifier.wosWOS:000316221500027
dc.language.isoeng
dc.relation.ispartofMicroscopy and Microanalysis
dc.relation.ispartofjcr2.124
dc.relation.ispartofsjr0,292
dc.relation.ispartofsjr0,292
dc.rights.accessRightsAcesso restrito
dc.sourceScopus
dc.subjectcorrelative microscopy
dc.subjectextended depth from focus reconstruction
dc.subjectimage processing
dc.subjectlight microscopy
dc.subjectquantitative fractography
dc.subjectscanning electron microscopy
dc.titleCorrelative fractography: Combining scanning electron microscopy and light microscopes for qualitative and quantitative analysis of fracture surfacesen
dc.typeArtigo
dcterms.licensehttp://journals.cambridge.org/action/displaySpecialPage?pageId=4676
unesp.campusUniversidade Estadual Paulista (Unesp), Faculdade de Engenharia, Guaratinguetápt
unesp.departmentMateriais e Tecnologia - FEGpt

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Guaratinguetá - FEG - Faculdade de Engenharia e Ciências