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Magneto-optical studies of the correlation between interface microroughness parameters and the photoluminescence line shape in GaAs/Ga0.7Al0.3As quantum wells

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dc.contributor.authorOliveira, José Brás Barreto de [UNESP]
dc.contributor.authorMeneses, E. A.
dc.contributor.authorDa Silva, E. C F
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionUniversidade Estadual de Campinas (UNICAMP)
dc.contributor.institutionUniversidade de São Paulo (USP)
dc.date.accessioned2014-05-27T11:19:48Z
dc.date.available2014-05-27T11:19:48Z
dc.date.issued1999-12-01
dc.description.abstractIn this work we analyze the relation between the interface microroughness and the full width at half maximum (FWHM) of the photoluminescence (PL) spectra for a GaAs/Ga0.7Al0.3As multiple quantum well (QW) system. We show that, in spite of the complex correlation between the microscopic interface-defects parameters and the QW optical properties, the Singh and Bajaj model [Appl. Phys. Lett. 44, 805 (1984)] provides a good quantitative description of the excitonic PL-FWHM. ©1999 The American Physical Society.en
dc.description.affiliationDepartamento de Física Universidade Estadual Paulista, Av. Eng. Luiz Edmundo C. Coube, s/n, 17033-360, Bauru, SP
dc.description.affiliationInst. de Física Gleb Wataghin Universidade Estadual de Campinas, Caixa Postal 6165, 13083-970 Campinas, SP
dc.description.affiliationInstituto de Física Universidade de São Paulo, Caixa Postal 66318, 05315-970, São Paulo, SP
dc.description.affiliationUnespDepartamento de Física Universidade Estadual Paulista, Av. Eng. Luiz Edmundo C. Coube, s/n, 17033-360, Bauru, SP
dc.format.extent1519-1522
dc.identifierhttp://dx.doi.org/10.1103/PhysRevB.60.1519
dc.identifier.citationPhysical Review B - Condensed Matter and Materials Physics, v. 60, n. 3, p. 1519-1522, 1999.
dc.identifier.doi10.1103/PhysRevB.60.1519
dc.identifier.file2-s2.0-0000622260.pdf
dc.identifier.issn0163-1829
dc.identifier.lattes6977466698742311
dc.identifier.scopus2-s2.0-0000622260
dc.identifier.urihttp://hdl.handle.net/11449/65940
dc.identifier.wosWOS:000081551500025
dc.language.isoeng
dc.relation.ispartofPhysical Review B: Condensed Matter and Materials Physics
dc.relation.ispartofsjr1,176
dc.rights.accessRightsAcesso aberto
dc.sourceScopus
dc.titleMagneto-optical studies of the correlation between interface microroughness parameters and the photoluminescence line shape in GaAs/Ga0.7Al0.3As quantum wellsen
dc.typeArtigo
dcterms.licensehttp://publish.aps.org/authors/transfer-of-copyright-agreement
dspace.entity.typePublication
unesp.author.lattes6977466698742311
unesp.author.orcid0000-0001-6059-2798[3]
unesp.campusUniversidade Estadual Paulista (UNESP), Faculdade de Ciências, Baurupt
unesp.departmentFísica - FCpt

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