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Objective Bayesian inference for the Capability index of the Weibull distribution and its generalization

dc.contributor.authorRamos, Pedro L.
dc.contributor.authorAlmeida, Marcello H.
dc.contributor.authorLouzada, Francisco
dc.contributor.authorFlores, Edilson
dc.contributor.authorMoala, Fernando A.
dc.contributor.institutionPontificia Universidad Católica de Chile
dc.contributor.institutionUniversidade de São Paulo (USP)
dc.date.accessioned2022-04-28T19:50:53Z
dc.date.available2022-04-28T19:50:53Z
dc.date.issued2022-05-01
dc.description.abstractThe Weibull distribution plays an important role in reliability and quality control monitoring. This model has been widely used to describe the process capability index (PCI) when data do not follow a normal distribution. In this scenario, the current studies focus on estimating the parameters using classical inference. In this paper, we consider Bayesian methods to estimate the PCI denominated Cpk from an objective perspective using reference priors. The proposed inference is further extended to a generalized version of the Weibull distribution that provides a good fit for more complex data with non-monotone hazard behavior. The posterior distributions are constructed and Bayes estimators based on the median are proposed. In this case, Markov Chain Monte Carlo methods are used to achieve the estimates and from an extensive simulation study, we observe that good results are observed in terms of mean relative and squared errors. The proposed approach is also used to construct adequate credibility intervals with low computational cost and accurate coverage probabilities. A real data application is presented which confirms that our proposed approach outperforms the current methods.en
dc.description.affiliationFacultad de Matemáticas Pontificia Universidad Católica de Chile, Macul
dc.description.affiliationDepartment of Statistics, State University of Sao Paulo
dc.description.affiliationInstitute of Mathematics and Computer Science University of São Paulo
dc.identifierhttp://dx.doi.org/10.1016/j.cie.2022.108012
dc.identifier.citationComputers and Industrial Engineering, v. 167.
dc.identifier.doi10.1016/j.cie.2022.108012
dc.identifier.issn0360-8352
dc.identifier.scopus2-s2.0-85124792326
dc.identifier.urihttp://hdl.handle.net/11449/223480
dc.language.isoeng
dc.relation.ispartofComputers and Industrial Engineering
dc.sourceScopus
dc.subjectObjective Bayesian inference
dc.subjectProcess capacity index
dc.subjectReference priors
dc.subjectWeibull distribution
dc.titleObjective Bayesian inference for the Capability index of the Weibull distribution and its generalizationen
dc.typeArtigo
dspace.entity.typePublication

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