Logotipo do repositório
 

Publicação:
Electrical behavior of cerium dioxide films exposed to different gases atmospheres

dc.contributor.authorDeus, R. C. [UNESP]
dc.contributor.authorAmoresi, R. A.C. [UNESP]
dc.contributor.authorDesimone, P. M.
dc.contributor.authorSchipani, F.
dc.contributor.authorRocha, L. S.R. [UNESP]
dc.contributor.authorPonce, M. A.
dc.contributor.authorSimoes, A. Z. [UNESP]
dc.contributor.authorLongo, E. [UNESP]
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionNational University of Mar del Plata (CONICET)
dc.date.accessioned2018-12-11T17:29:09Z
dc.date.available2018-12-11T17:29:09Z
dc.date.issued2016-10-01
dc.description.abstractHere we present an easy-reproducible microwave-assisted hydrothermal route for preparing pure nanocrystalline CeO2 films. The produced materials were characterized using a wide range of techniques (X-ray diffraction, field emission gun scanning electron microscopy, Raman spectroscopy) to understand the synthesis dependent changes in crystallographic structure, and crystallite size. Raman and X-ray diffraction techniques revealed that the films were free of secondary phases and that they crystallize in the cubic structure. The observed hydrodynamic particle size larger than the crystallite size confirms the aggregation phenomenon. Gas sensing measurements have been carried out to rationalize the type and number of surface adsorbed groups and overall nanostructure. Electrical conductance variations, owing to gases adsorption onto semiconductor oxide films surfaces, were observed in this work. Chemiresistive CeO2 film properties depend on the intergranular barrier heights and width.en
dc.description.affiliationFaculty of Engineering of Guaratinguetá São Paulo State University – UNESP, Av. Dr Ariberto Pereira da Cunha 333, Bairro Pedregulho, P.O. Box 355
dc.description.affiliationInterdisciplinary Laboratory of Electrochemistry and Ceramics LIEC – Chemistry Institute São Paulo State University – UNESP, Prof. Francisco Degni Street, 55, Quitandinha
dc.description.affiliationResearch Institute of Materials Science and Technology (INTEMA) National University of Mar del Plata (CONICET), Juan B. Justo Street 4302
dc.description.affiliationUnespFaculty of Engineering of Guaratinguetá São Paulo State University – UNESP, Av. Dr Ariberto Pereira da Cunha 333, Bairro Pedregulho, P.O. Box 355
dc.description.affiliationUnespInterdisciplinary Laboratory of Electrochemistry and Ceramics LIEC – Chemistry Institute São Paulo State University – UNESP, Prof. Francisco Degni Street, 55, Quitandinha
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.description.sponsorshipIdFAPESP: 2013/07296-2
dc.description.sponsorshipIdCNPq: 573636/2008-7
dc.format.extent15023-15029
dc.identifierhttp://dx.doi.org/10.1016/j.ceramint.2016.06.151
dc.identifier.citationCeramics International, v. 42, n. 13, p. 15023-15029, 2016.
dc.identifier.doi10.1016/j.ceramint.2016.06.151
dc.identifier.file2-s2.0-84979691943.pdf
dc.identifier.issn0272-8842
dc.identifier.scopus2-s2.0-84979691943
dc.identifier.urihttp://hdl.handle.net/11449/178176
dc.language.isoeng
dc.relation.ispartofCeramics International
dc.relation.ispartofsjr0,784
dc.rights.accessRightsAcesso aberto
dc.sourceScopus
dc.subjectA. Films
dc.subjectB. Defects
dc.subjectC. Chemical properties
dc.subjectD. CeO2
dc.subjectE. Sensors
dc.titleElectrical behavior of cerium dioxide films exposed to different gases atmospheresen
dc.typeArtigo
dspace.entity.typePublication
unesp.author.lattes3573363486614904[7]
unesp.author.orcid0000-0003-2535-2187[7]
unesp.campusUniversidade Estadual Paulista (UNESP), Instituto de Química, Araraquarapt
unesp.departmentMateriais e Tecnologia - FEGpt
unesp.departmentBioquímica e Tecnologia - IQpt

Arquivos

Pacote Original

Agora exibindo 1 - 1 de 1
Carregando...
Imagem de Miniatura
Nome:
2-s2.0-84979691943.pdf
Tamanho:
1.52 MB
Formato:
Adobe Portable Document Format
Descrição: