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Publicação:
Instantaneous Phase Threshold for Reflector Detection in Ultrasonic Images

dc.contributor.authorPrado, Vander Teixeira [UNESP]
dc.contributor.authorHiguti, Ricardo Tokio [UNESP]
dc.contributor.authorKitano, Claudio [UNESP]
dc.contributor.authorMartinez-Graullera, Oscar
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionCSIC
dc.date.accessioned2014-12-03T13:11:50Z
dc.date.available2014-12-03T13:11:50Z
dc.date.issued2014-07-01
dc.description.abstractA method for reflector detection, based on the instantaneous phase of the aperture data for ultrasonic images, is proposed. The instantaneous phase (IP) image is obtained by replacing the amplitude information by the instantaneous phase in the delay-and-sum (DAS) beamforming. From the analysis of the IP image, a threshold level is defined in terms of the number of signals used for imaging. This threshold is applied to the IP image, resulting in a two-level image which gives a statistical indication of whether the pixels of a region in the image are related to a reflector or noise/artifacts. Because the proposed method uses only the instantaneous phase of the signals, it is less sensitive to attenuation than conventional DAS amplitude images. The point spread function of a 32-element array with half-wavelength pitch at 5 MHz in water is simulated and the reflector is detected for signal-to-noise ratio values larger than -29.6 dB. A phantom and an aluminum plate with artificial defects are tested with the proposed technique, using linear arrays of 64 and 16 elements, respectively. When compared with DAS amplitude images and with two-level images obtained by thresholding the amplitude images using empirical threshold values, the proposed technique reduced artifacts and dead zone, and detected all reflectors, increasing reflectors' detectability and decreasing the occurrence of false indication of reflectors. The proposed technique can be used as additional information for amplitude image analysis, with the advantages that it does not need time-gain compensation and that it considers an objective threshold value.en
dc.description.affiliationUniv Estadual Paulista UNESP, Fac Engn Ilha Solteira, Dept Elect Engn, Ilha Solteira, SP, Brazil
dc.description.affiliationCSIC, Inst Tecnol Fis & Informac Leonardo Torres Queved, Madrid, Spain
dc.description.affiliationUnespUniv Estadual Paulista UNESP, Fac Engn Ilha Solteira, Dept Elect Engn, Ilha Solteira, SP, Brazil
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.description.sponsorshipgovernment of Spain
dc.description.sponsorshipIdFAPESP: 10/02240-0
dc.description.sponsorshipIdFAPESP: 10/16400-0
dc.description.sponsorshipIdFAPESP: 13/00330-0
dc.description.sponsorshipIdgovernment of SpainCICYT - DPI 2010 19376
dc.format.extent1204-1215
dc.identifierhttp://dx.doi.org/10.1109/TUFFC.2014.3019
dc.identifier.citationIeee Transactions On Ultrasonics Ferroelectrics And Frequency Control. Piscataway: Ieee-inst Electrical Electronics Engineers Inc, v. 61, n. 7, p. 1204-1215, 2014.
dc.identifier.doi10.1109/TUFFC.2014.3019
dc.identifier.issn0885-3010
dc.identifier.lattes6405339510883203
dc.identifier.lattes2883440351895167
dc.identifier.orcid0000-0003-4201-5617
dc.identifier.orcid0000-0001-6320-755X
dc.identifier.urihttp://hdl.handle.net/11449/113618
dc.identifier.wosWOS:000338665500013
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofIEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control
dc.relation.ispartofjcr2.704
dc.relation.ispartofsjr1,183
dc.rights.accessRightsAcesso restrito
dc.sourceWeb of Science
dc.titleInstantaneous Phase Threshold for Reflector Detection in Ultrasonic Imagesen
dc.typeArtigo
dcterms.licensehttp://www.ieee.org/publications_standards/publications/rights/rights_policies.html
dcterms.rightsHolderIeee-inst Electrical Electronics Engineers Inc
dspace.entity.typePublication
unesp.author.lattes6405339510883203[2]
unesp.author.lattes2883440351895167[3]
unesp.author.orcid0000-0001-6320-755X[3]
unesp.author.orcid0000-0003-4201-5617[2]
unesp.campusUniversidade Estadual Paulista (UNESP), Faculdade de Engenharia, Ilha Solteirapt
unesp.departmentEngenharia Elétrica - FEISpt

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