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An Atomic Force Microscopy (AFM) Modelling in Fractional Order: Nonlinear Control System Design

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dc.contributor.authorYamaguchi, Patricia S. [UNESP]
dc.contributor.authorTusset, Angelo M.
dc.contributor.authorRibeiro, Mauricio A.
dc.contributor.authorBalthazar, Jose M. [UNESP]
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)
dc.contributor.institutionFederal University of Technology Paraná
dc.date.accessioned2023-03-01T20:13:26Z
dc.date.available2023-03-01T20:13:26Z
dc.date.issued2022-10-01
dc.description.abstractThe atomic force microscope (AFM) on the nanoscale measurements comes from nanotechnology and is currently a multidisciplinary field of research. The present research proposal aims to contribute to scientific research on AFM considering that the system is operating in the intermittent mode and the contact of the tip with sample generates a damping represented by squeeze-film damping, and that the damping dynamics of the squeeze-film damping can be represented by fractional calculus through numerical simulation and dynamic analysis to prove chaotic regimes. To suppress chaotic behavior, we will use and analyze two control strategies, the SDRE (Riccati Equation Dependent States) and OLFC (Linear Control for Optimum Feedback) controls.en
dc.description.affiliationUNESP São Paulo State University, SP
dc.description.affiliationUTFPR Federal University of Technology Paraná
dc.description.affiliationUnespUNESP São Paulo State University, SP
dc.identifierhttp://dx.doi.org/10.1007/s13538-022-01155-y
dc.identifier.citationBrazilian Journal of Physics, v. 52, n. 5, 2022.
dc.identifier.dimensionspub.1149027403
dc.identifier.doi10.1007/s13538-022-01155-y
dc.identifier.issn1678-4448
dc.identifier.issn0103-9733
dc.identifier.orcid0000-0003-3144-0407
dc.identifier.orcid0000-0002-9796-3609
dc.identifier.orcid0000-0002-6082-4832
dc.identifier.orcid0000-0001-8360-937X
dc.identifier.scopus2-s2.0-85132968985
dc.identifier.urihttp://hdl.handle.net/11449/240357
dc.language.isoeng
dc.publisherSpringer Nature
dc.relation.ispartofBrazilian Journal of Physics
dc.rights.accessRightsAcesso abertopt
dc.rights.sourceRightsoa_all
dc.rights.sourceRightsgreen
dc.sourceScopus
dc.sourceDimensions
dc.subjectAFM
dc.subjectChaos
dc.subjectDerivative fractional order
dc.subjectOptimal linear control
dc.subjectSDRE control
dc.titleAn Atomic Force Microscopy (AFM) Modelling in Fractional Order: Nonlinear Control System Designen
dc.typeArtigopt
dspace.entity.typePublication
unesp.author.orcid0000-0001-8360-937X[1]
unesp.author.orcid0000-0003-3144-0407[2]
unesp.author.orcid0000-0001-7314-0723[3]
unesp.author.orcid0000-0002-9796-3609[4]

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