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Stepped light-induced transient measurements of photocurrent and voltage in dye-sensitized solar cells based on ZnO and ZnO:Ga

dc.contributor.authorGoncalves, Agnaldo de Souza [UNESP]
dc.contributor.authorDavolos, Marian Rosaly [UNESP]
dc.contributor.authorMasaki, Naruhiko
dc.contributor.authorYanagida, Shozo
dc.contributor.authorMori, Shogo
dc.contributor.authorNogueira, Ana F.
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionOsaka Univ
dc.contributor.institutionUniversidade Estadual de Campinas (UNICAMP)
dc.contributor.institutionShinshu Univ
dc.date.accessioned2014-05-20T15:34:02Z
dc.date.available2014-05-20T15:34:02Z
dc.date.issued2009-09-15
dc.description.abstractIn order to explain the higher short-circuit current (J(sc)) with comparable open-circuit voltage (V(oc)) from dye-sensitized solar cells (DSCs) based on gallium-modified ZnO (ZnO:Ga) porous electrodes, the diffusion coefficient (D) and electron lifetime (tau) in DSCs with and without Ga-modified ZnO were studied by stepped light-induced transient measurements of photocurrent and voltage. In comparison to DSCs based on ZnO electrodes, the ZnO:Ga-based solar cells provided lower D and higher tau values. The results were interpreted according to the transport-limited recombination model, where the Ga modification induced a higher density of intraband charge traps. At matched electron densities, a decrease in V(oc) from DSCs based on ZnO:Ga was observed, suggesting a positive shift of the ZnO:Ga conduction band edge. The higher J(sc) can be explained by the positive shift of the ZnO:Ga conduction band edge in addition to the increased roughness factor of the electrode due to the Ga modification. (C) 2009 American Institute of Physics. [doi:10.1063/1.3226073]en
dc.description.affiliationUniv Estadual Paulista, Inst Chem, BR-14800900 Araraquara, SP, Brazil
dc.description.affiliationOsaka Univ, Ctr Adv Sci & Innovat, Suita, Osaka 5650871, Japan
dc.description.affiliationUniv Estadual Campinas, Inst Chem, BR-13083970 Campinas, SP, Brazil
dc.description.affiliationShinshu Univ, Dept Fine Mat Engn, Ueda, Nagano 3868567, Japan
dc.description.affiliationUnespUniv Estadual Paulista, Inst Chem, BR-14800900 Araraquara, SP, Brazil
dc.description.sponsorshipCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
dc.description.sponsorshipRenami
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.format.extent4
dc.identifierhttp://dx.doi.org/10.1063/1.3226073
dc.identifier.citationJournal of Applied Physics. Melville: Amer Inst Physics, v. 106, n. 6, p. 4, 2009.
dc.identifier.doi10.1063/1.3226073
dc.identifier.fileWOS000270378100134.pdf
dc.identifier.issn0021-8979
dc.identifier.lattes4284809342546287
dc.identifier.urihttp://hdl.handle.net/11449/42401
dc.identifier.wosWOS:000270378100134
dc.language.isoeng
dc.publisherAmerican Institute of Physics (AIP)
dc.relation.ispartofJournal of Applied Physics
dc.relation.ispartofjcr2.176
dc.relation.ispartofsjr0,739
dc.rights.accessRightsAcesso aberto
dc.sourceWeb of Science
dc.titleStepped light-induced transient measurements of photocurrent and voltage in dye-sensitized solar cells based on ZnO and ZnO:Gaen
dc.typeArtigo
dcterms.licensehttp://www.aip.org/pubservs/web_posting_guidelines.html
dcterms.rightsHolderAmer Inst Physics
dspace.entity.typePublication
unesp.author.lattes4284809342546287
unesp.author.orcid0000-0001-8326-1465[2]
unesp.campusUniversidade Estadual Paulista (UNESP), Instituto de Química, Araraquarapt
unesp.departmentQuímica Inorgânica - IQARpt

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