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Temperature dependence of dielectric properties for Ba(Zr0.25Ti0.75)O-3 thin films obtained from the soft chemical method

dc.contributor.authorMarques, L. G. A.
dc.contributor.authorCavalcante, L. S.
dc.contributor.authorSimoes, A. Z.
dc.contributor.authorPontes, F. M.
dc.contributor.authorSantos-Junior, L. S.
dc.contributor.authorSantos, M. R. M. C.
dc.contributor.authorRosa, I. L. V.
dc.contributor.authorVarela, José Arana [UNESP]
dc.contributor.authorLongo, Elson [UNESP]
dc.contributor.institutionUniversidade Federal de São Carlos (UFSCar)
dc.contributor.institutionUniversidade Federal do Piauí (UFPI)
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-20T14:17:57Z
dc.date.available2014-05-20T14:17:57Z
dc.date.issued2007-10-15
dc.description.abstractBa(Zr0.25Ti0.75)O-3(BZT) thin films prepared by the polymeric precursor method (PPM) were annealed at 500, 600, and 700 degrees C for 4h. All films crystallized in the perovskite structure present a crack-free microstructure. Dielectric properties of the BZT thin films were investigated as a function of frequency and applied voltage. The dielectric constant of the films were 36, 152 and 145 at 1 kHz, while the dielectric loss were 0.08, 0.08, and 0.12 at 1 MHz. (c) 2007 Elsevier B.V. All rights reserved.en
dc.description.affiliationUniv Fed Sao Carlos, Dept Quim, Lab Interdisciplinar Eletroquim & Ceram, BR-13565905 Sao Carlos, SP, Brazil
dc.description.affiliationUniv Fed Piaui, Dept Quim, Ctr Ciências Nat, BR-64049550 Teresina, PI, Brazil
dc.description.affiliationUniv Estadual Paulista, Dept Quim, BR-17033360 Bauru, SP, Brazil
dc.description.affiliationUniv Estadual Paulista, Inst Quim, Dept Quim Fis, Lab Interdisciplinar Ceram, BR-14801907 Araraquara, SP, Brazil
dc.description.affiliationUnespUniv Estadual Paulista, Dept Quim, BR-17033360 Bauru, SP, Brazil
dc.description.affiliationUnespUniv Estadual Paulista, Inst Quim, Dept Quim Fis, Lab Interdisciplinar Ceram, BR-14801907 Araraquara, SP, Brazil
dc.format.extent293-297
dc.identifierhttp://dx.doi.org/10.1016/j.matchemphys.2007.04.065
dc.identifier.citationMaterials Chemistry and Physics. Lausanne: Elsevier B.V. Sa, v. 105, n. 2-3, p. 293-297, 2007.
dc.identifier.dimensionspub.1001265135
dc.identifier.doi10.1016/j.matchemphys.2007.04.065
dc.identifier.issn0254-0584
dc.identifier.issn1879-3312
dc.identifier.orcid0000-0002-0782-4876
dc.identifier.orcid0000-0001-6086-5303
dc.identifier.orcid0000-0003-2535-2187
dc.identifier.orcid0000-0002-0928-9619
dc.identifier.orcid0000-0003-0415-2944
dc.identifier.orcid0000-0001-8062-7791
dc.identifier.urihttp://hdl.handle.net/11449/25390
dc.identifier.wosWOS:000250278300029
dc.language.isoeng
dc.publisherElsevier B.V.
dc.publisherElsevier
dc.relation.ispartofMaterials Chemistry and Physics
dc.relation.ispartofjcr2.210
dc.relation.ispartofsjr0,615
dc.rights.accessRightsAcesso restritopt
dc.sourceWeb of Science
dc.sourceDimensions
dc.subjectdielectric propertiespt
dc.subjectBZTpt
dc.subjectthin filmspt
dc.subjecttemperature dependencept
dc.titleTemperature dependence of dielectric properties for Ba(Zr0.25Ti0.75)O-3 thin films obtained from the soft chemical methoden
dc.typeArtigopt
dcterms.licensehttp://www.elsevier.com/about/open-access/open-access-policies/article-posting-policy
dcterms.rightsHolderElsevier B.V.
dspace.entity.typePublication
relation.isDepartmentOfPublication07a200d2-8576-430b-966f-858ac732e282
relation.isDepartmentOfPublication.latestForDiscovery07a200d2-8576-430b-966f-858ac732e282
relation.isOrgUnitOfPublicationbc74a1ce-4c4c-4dad-8378-83962d76c4fd
relation.isOrgUnitOfPublicationaef1f5df-a00f-45f4-b366-6926b097829b
relation.isOrgUnitOfPublication.latestForDiscoverybc74a1ce-4c4c-4dad-8378-83962d76c4fd
unesp.author.lattes3573363486614904[3]
unesp.author.orcid0000-0003-2535-2187[3]
unesp.campusUniversidade Estadual Paulista (UNESP), Instituto de Química, Araraquarapt
unesp.campusUniversidade Estadual Paulista (UNESP), Faculdade de Ciências, Baurupt
unesp.departmentQuímica - FCpt
unesp.departmentFísico-Química - IQARpt

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