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Publicação:
Lamb mode diversity imaging for non-destructive testing of plate-like structures

dc.contributor.authorPrado, Vander T. [UNESP]
dc.contributor.authorHiguti, Ricardo T. [UNESP]
dc.contributor.authorKitano, Cláudio [UNESP]
dc.contributor.authorMartínez-Graullera, Óscar
dc.contributor.authorAdamowski, Julio C.
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionCentro de Acústica Aplicada y Evaluación No-Destructiva (CAEND/CSIC)
dc.contributor.institutionUniversidade de São Paulo (USP)
dc.date.accessioned2014-05-27T11:29:58Z
dc.date.available2014-05-27T11:29:58Z
dc.date.issued2013-07-18
dc.description.abstractSeveral Lamb wave modes can be coupled to a particular structure, depending on its geometry and transducer used to generate the guided waves. Each Lamb mode interacts in a particular form with different types of defects, like notches, delamination, surface defects, resulting in different information which can be used to improve damage detection and characterization. An image compounding technique that uses the information obtained from different propagation modes of Lamb waves for non-destructive testing of plate-like structures is proposed. A linear array consisting of 16 piezoelectric elements is attached to a 1 mm thickness aluminum plate, coupling the fundamental A0 and S0 modes at the frequencies of 100 kHz and 360 kHz, respectively. For each mode two images are obtained from amplitude and phase information: one image using the Total Focusing Method (TFM) and one phase image obtained from the Sign Coherence Factor (SCF). Each TFM image is multiplied by the SCF image of the respective mode to improve contrast and reduce side and grating lobes effects. The high dispersive characteristic of the A0 mode is compensated for adequate defect detection. The information in the SCF images is used to select one of the TFM mode images, at each pixel, to obtain the compounded image. As a result, dead zone is reduced, resolution and contrast are improved, enhancing damage detection when compared to the use of only one mode. © 2013 Elsevier Ltd.en
dc.description.affiliationUniversidade Estadual Paulista (UNESP) Faculdade de Engenharia Department of Electrical Engineering, Ilha Solteira, SP
dc.description.affiliationConsejo Superior de Investigaciones Científicas Centro de Acústica Aplicada y Evaluación No-Destructiva (CAEND/CSIC), Madrid
dc.description.affiliationUniversidade de São Paulo Department of Mechatronic and Mechanical Systems Engineering, São Paulo
dc.description.affiliationUnespUniversidade Estadual Paulista (UNESP) Faculdade de Engenharia Department of Electrical Engineering, Ilha Solteira, SP
dc.format.extent86-95
dc.identifierhttp://dx.doi.org/10.1016/j.ndteint.2013.06.001
dc.identifier.citationNDT and E International, v. 59, p. 86-95.
dc.identifier.doi10.1016/j.ndteint.2013.06.001
dc.identifier.issn0963-8695
dc.identifier.lattes2883440351895167
dc.identifier.lattes6405339510883203
dc.identifier.orcid0000-0003-4201-5617
dc.identifier.orcid0000-0001-6320-755X
dc.identifier.scopus2-s2.0-84880114512
dc.identifier.urihttp://hdl.handle.net/11449/76000
dc.identifier.wosWOS:000323297900011
dc.language.isoeng
dc.relation.ispartofNDT and E International
dc.relation.ispartofjcr2.781
dc.relation.ispartofsjr1,205
dc.rights.accessRightsAcesso restrito
dc.sourceScopus
dc.subjectArrays
dc.subjectDamage detection
dc.subjectImage compounding
dc.subjectLamb wave modes
dc.subjectCompounding techniques
dc.subjectDispersive characteristic
dc.subjectLamb wave mode
dc.subjectNon destructive testing
dc.subjectPiezoelectric elements
dc.subjectPlate-like structure
dc.subjectSign coherence factors
dc.subjectNondestructive examination
dc.subjectSurface defects
dc.subjectUltrasonic waves
dc.subjectPlates (structural components)
dc.titleLamb mode diversity imaging for non-destructive testing of plate-like structuresen
dc.typeArtigo
dcterms.licensehttp://www.elsevier.com/about/open-access/open-access-policies/article-posting-policy
dspace.entity.typePublication
unesp.author.lattes6405339510883203[2]
unesp.author.lattes2883440351895167[3]
unesp.author.orcid0000-0001-6320-755X[3]
unesp.author.orcid0000-0003-4201-5617[2]
unesp.campusUniversidade Estadual Paulista (UNESP), Faculdade de Engenharia, Ilha Solteirapt
unesp.departmentEngenharia Elétrica - FEISpt

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