Logotipo do repositório
 

Publicação:
Effect of mechanical loading on the I-c degradation behavior of Bi-2223 tapes

dc.contributor.authorBaldan, C. A.
dc.contributor.authorShigue, C. Y.
dc.contributor.authorRuppert, E.
dc.contributor.authorOliveira, U. R.
dc.contributor.institutionUniversidade de São Paulo (USP)
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionUniversidade Estadual de Campinas (UNICAMP)
dc.date.accessioned2014-05-20T15:26:20Z
dc.date.available2014-05-20T15:26:20Z
dc.date.issued2005-06-01
dc.description.abstractDuring the winding process of HTS coils the tapes of Bi-2223 are subjected to the influence of bending strain, axial strain, compressive force and torsional deformation resulting in I-c degradation. In the literature the effects of the individual strain components are separately analyzed in spite of during coil winding and energizing the strain-stress effects are combined. In this work using commercial tapes of Bi-2223 Ag/AgMg with and without stainless steel reinforcement several samples were wound on cylindrical FRP G-10 holder in which different combined strains are applied. Measurements of I - V characteristic curves are done to determine the degree of critical current degradation and the operational limits. The results are compared with the I, values of short samples and other specimens subjected to deformation generated by loading types such as tensile and bending strain.en
dc.description.affiliationDEMAR, Dept Mat Engn, FAENQUIL, Fac Engn Quim Lorena, Lorena, SP, Brazil
dc.description.affiliationUNESP, Fac Engn Guaratingueta, Guaratingueta, SP, Brazil
dc.description.affiliationUniv Estadual Campinas, Fac Engn Eletr & Computac, Campinas, SP, Brazil
dc.description.affiliationUnespUNESP, Fac Engn Guaratingueta, Guaratingueta, SP, Brazil
dc.format.extent3552-3555
dc.identifierhttp://dx.doi.org/10.1109/TASC.2005.849357
dc.identifier.citationIEEE Transactions on Applied Superconductivity. Piscataway: IEEE-Inst Electrical Electronics Engineers Inc., v. 15, n. 2, p. 3552-3555, 2005.
dc.identifier.doi10.1109/TASC.2005.849357
dc.identifier.issn1051-8223
dc.identifier.urihttp://hdl.handle.net/11449/36513
dc.identifier.wosWOS:000229767200283
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofIEEE Transactions on Applied Superconductivity
dc.relation.ispartofjcr1.288
dc.relation.ispartofsjr0,408
dc.rights.accessRightsAcesso restritopt
dc.sourceWeb of Science
dc.subjectBi-2223 tapespt
dc.subjectcritical currentpt
dc.subjectHTS coilspt
dc.subjectI-cpt
dc.subjectdegradationpt
dc.subjectstress-strainpt
dc.titleEffect of mechanical loading on the I-c degradation behavior of Bi-2223 tapesen
dc.typeArtigopt
dcterms.licensehttp://www.ieee.org/publications_standards/publications/rights/rights_policies.html
dcterms.rightsHolderIEEE-Inst Electrical Electronics Engineers Inc
dspace.entity.typePublication
unesp.author.orcid0000-0002-4327-0137[2]
unesp.campusUniversidade Estadual Paulista (UNESP), Faculdade de Engenharia e Ciências, Guaratinguetápt

Arquivos

Licença do Pacote

Agora exibindo 1 - 1 de 1
Carregando...
Imagem de Miniatura
Nome:
license.txt
Tamanho:
1.71 KB
Formato:
Item-specific license agreed upon to submission
Descrição: