Publicação: Structural phase evolution of strontium-doped lead titanate thin films prepared by the soft chemical technique
Carregando...
Arquivos
Data
Orientador
Coorientador
Pós-graduação
Curso de graduação
Título da Revista
ISSN da Revista
Título de Volume
Editor
Tipo
Artigo
Direito de acesso
Acesso aberto
Resumo
Strontium-modified lead titanate thin films with composition Pb1-xSrxTiO3 were grown on Pt/Ti/SiO2/Si substrates using the polymeric precursor method. The structural phase evolution as a function of the Sr contents was studied using micro-Raman scattering, specular reflectance infrared Fourier transform spectroscopy, and x-ray diffraction. The results showed a gradual change from tetragonal to cubic structure, the transition occurring at about x = 0.58. The infrared reflectance spectra showed that the frequency of several peaks decreases as the strontium concentration increases. These features are correlated with a decrease in the tetragonal distortion of the TiO6 octahedra as the strontium concentration increases.
Descrição
Palavras-chave
Doping (additives), Fourier transform infrared spectroscopy, Lead compounds, Raman scattering, Strontium, X ray diffraction analysis, Soft chemical techniques, Thin films
Idioma
Inglês
Como citar
Journal of Materials Research, v. 18, n. 3, p. 659-663, 2003.
