Logo do repositório
 

Influence of temperature on the microstructure and electrical properties of BBT thin films

Página do item simplificado
dc.contributor.authorCosta, G. C.
dc.contributor.authorSimoes, A. Z.
dc.contributor.authorRies, A.
dc.contributor.authorRiccardi, C. S.
dc.contributor.authorStojanovic, B. D.
dc.contributor.authorCilense, M.
dc.contributor.authorZaghete, M.
dc.contributor.authorVarela, José Arana [UNESP]
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionUniversity of Belgrade
dc.date.accessioned2014-05-20T15:28:23Z
dc.date.available2014-05-20T15:28:23Z
dc.date.issued2003-01-01
dc.description.abstractThe BBT films were prepared by a spin-coating process from the polymeric precursor method (Pechini process). In order to study the influence of the temperature on the BBT microstructure and electrical properties, the films were deposited on platinum coated silicon substrates and annealed from 700degreesC to 800degreesC for 2 hours in oxygen atmosphere. The crystallinity of the films was examined by X-ray diffraction while the surface morphology was analysed by atomic force microscope. The dielectric properties and dissipation factor of BaBi2Ta2O9 films at 1 MHz were observed. The polarization-electric field hysteresis loops revealed the ferroelectric characteristics of BaBi2Ta2O9 thin films.en
dc.description.affiliationUniv Estadual Paulista, UNESP, Inst Chem, BR-14801970 Araraquara, SP, Brazil
dc.description.affiliationUniv Belgrade, Ctr Multidisciplinary Studies, YU-11001 Belgrade, Yugoslavia
dc.description.affiliationUnespUniv Estadual Paulista, UNESP, Inst Chem, BR-14801970 Araraquara, SP, Brazil
dc.format.extent103-112
dc.identifierhttp://dx.doi.org/10.1080/10584580390229978
dc.identifier.citationIntegrated Ferroelectrics. Abingdon: Taylor & Francis Ltd, v. 51, p. 103-112, 2003.
dc.identifier.doi10.1080/10584580390229978
dc.identifier.issn1058-4587
dc.identifier.lattes9128353103083394
dc.identifier.urihttp://hdl.handle.net/11449/38191
dc.identifier.wosWOS:000185295400009
dc.language.isoeng
dc.publisherTaylor & Francis Ltd
dc.relation.ispartofIntegrated Ferroelectrics
dc.relation.ispartofjcr0.367
dc.relation.ispartofsjr0,182
dc.rights.accessRightsAcesso restritopt
dc.sourceWeb of Science
dc.subjectBBTpt
dc.subjectthin filmspt
dc.subjectelectrical propertiespt
dc.titleInfluence of temperature on the microstructure and electrical properties of BBT thin filmsen
dc.typeArtigopt
dcterms.licensehttp://journalauthors.tandf.co.uk/permissions/reusingOwnWork.asp
dcterms.rightsHolderTaylor & Francis Ltd
dspace.entity.typePublication
relation.isOrgUnitOfPublicationbc74a1ce-4c4c-4dad-8378-83962d76c4fd
relation.isOrgUnitOfPublication.latestForDiscoverybc74a1ce-4c4c-4dad-8378-83962d76c4fd
unesp.author.lattes9128353103083394
unesp.author.lattes3573363486614904[2]
unesp.author.lattes0173401604473200[4]
unesp.author.orcid0000-0003-2535-2187[2]
unesp.author.orcid0000-0003-2192-5312[4]
unesp.campusUniversidade Estadual Paulista (UNESP), Instituto de Química, Araraquarapt
unesp.departmentFísico-Química - IQARpt

Arquivos

Licença do pacote

Agora exibindo 1 - 1 de 1
Imagem de Miniatura
Nome:
license.txt
Tamanho:
1.71 KB
Formato:
Item-specific license agreed upon to submission
Descrição:

Coleções

Araraquara - IQAR - Instituto de Química