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Publicação:
Electrical properties of boron doped CVD diamond after plasma cleaning probed by capacitance-voltage profiling

dc.contributor.authorAraujo, Luana S.
dc.contributor.authorBerengue, Olivia [UNESP]
dc.contributor.authorBaldan, Maurício
dc.contributor.authorFerreira, Neidenei
dc.contributor.authorMoro, Joaõ
dc.contributor.authorChiquito, Adenilson
dc.contributor.institutionUniversidade Federal de São Carlos (UFSCar)
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)
dc.contributor.institutionLAS/INPE
dc.contributor.institutionCiencia e Tecnologia de Sao Paulo
dc.date.accessioned2022-04-28T19:00:31Z
dc.date.available2022-04-28T19:00:31Z
dc.date.issued2014-11-14
dc.description.abstractDoped diamond films grown by chemical vapor techniques has been used to study hydrogen and oxygen terminated diamond. It is known that the electrical characteristics of metal-diamond interface are strongly affected by the diamond surface features. O2 plasma treatment was used as a cleaning procedure for as grown diamond samples leading to changes in the capacitance measurements after treatment. The alteration in the characteristics of the samples can be attributed to the surface adsorbates like hydrogen and water vapor present in the atmosphere. The results indicates that the O2 plasma treatment was effective in cleaning the surface revealing the expected features of a p-type diamond film.en
dc.description.affiliationNanO LaB-Departamento de Fisica Universidade Federal de Sao Carlos
dc.description.affiliationFaculdade de Engenharia de Guaratingueta Universidade Estadual Júlio de Mesquita Filho
dc.description.affiliationLaboratorio Associado de Sensores e Materiais LAS/INPE
dc.description.affiliationInstituto Federal de Educacao Ciencia e Tecnologia de Sao Paulo
dc.description.affiliationUnespFaculdade de Engenharia de Guaratingueta Universidade Estadual Júlio de Mesquita Filho
dc.identifierhttp://dx.doi.org/10.1557/opl.2014.701
dc.identifier.citationInternational Review of the Red Cross, v. 1634, n. 1, 2014.
dc.identifier.doi10.1557/opl.2014.701
dc.identifier.issn1607-5889
dc.identifier.issn1816-3831
dc.identifier.scopus2-s2.0-84913618512
dc.identifier.urihttp://hdl.handle.net/11449/220262
dc.language.isoeng
dc.relation.ispartofInternational Review of the Red Cross
dc.sourceScopus
dc.subjectDiamond
dc.subjectsurface reaction
dc.subjectthin film
dc.titleElectrical properties of boron doped CVD diamond after plasma cleaning probed by capacitance-voltage profilingen
dc.typeArtigopt
dspace.entity.typePublication
unesp.campusUniversidade Estadual Paulista (UNESP), Faculdade de Engenharia e Ciências, Guaratinguetápt

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