Publicação: Electrical properties of boron doped CVD diamond after plasma cleaning probed by capacitance-voltage profiling
dc.contributor.author | Araujo, Luana S. | |
dc.contributor.author | Berengue, Olivia [UNESP] | |
dc.contributor.author | Baldan, Maurício | |
dc.contributor.author | Ferreira, Neidenei | |
dc.contributor.author | Moro, Joaõ | |
dc.contributor.author | Chiquito, Adenilson | |
dc.contributor.institution | Universidade Federal de São Carlos (UFSCar) | |
dc.contributor.institution | Universidade Estadual Paulista (UNESP) | |
dc.contributor.institution | LAS/INPE | |
dc.contributor.institution | Ciencia e Tecnologia de Sao Paulo | |
dc.date.accessioned | 2022-04-28T19:00:31Z | |
dc.date.available | 2022-04-28T19:00:31Z | |
dc.date.issued | 2014-11-14 | |
dc.description.abstract | Doped diamond films grown by chemical vapor techniques has been used to study hydrogen and oxygen terminated diamond. It is known that the electrical characteristics of metal-diamond interface are strongly affected by the diamond surface features. O2 plasma treatment was used as a cleaning procedure for as grown diamond samples leading to changes in the capacitance measurements after treatment. The alteration in the characteristics of the samples can be attributed to the surface adsorbates like hydrogen and water vapor present in the atmosphere. The results indicates that the O2 plasma treatment was effective in cleaning the surface revealing the expected features of a p-type diamond film. | en |
dc.description.affiliation | NanO LaB-Departamento de Fisica Universidade Federal de Sao Carlos | |
dc.description.affiliation | Faculdade de Engenharia de Guaratingueta Universidade Estadual Júlio de Mesquita Filho | |
dc.description.affiliation | Laboratorio Associado de Sensores e Materiais LAS/INPE | |
dc.description.affiliation | Instituto Federal de Educacao Ciencia e Tecnologia de Sao Paulo | |
dc.description.affiliationUnesp | Faculdade de Engenharia de Guaratingueta Universidade Estadual Júlio de Mesquita Filho | |
dc.identifier | http://dx.doi.org/10.1557/opl.2014.701 | |
dc.identifier.citation | International Review of the Red Cross, v. 1634, n. 1, 2014. | |
dc.identifier.doi | 10.1557/opl.2014.701 | |
dc.identifier.issn | 1607-5889 | |
dc.identifier.issn | 1816-3831 | |
dc.identifier.scopus | 2-s2.0-84913618512 | |
dc.identifier.uri | http://hdl.handle.net/11449/220262 | |
dc.language.iso | eng | |
dc.relation.ispartof | International Review of the Red Cross | |
dc.source | Scopus | |
dc.subject | Diamond | |
dc.subject | surface reaction | |
dc.subject | thin film | |
dc.title | Electrical properties of boron doped CVD diamond after plasma cleaning probed by capacitance-voltage profiling | en |
dc.type | Artigo | pt |
dspace.entity.type | Publication | |
unesp.campus | Universidade Estadual Paulista (UNESP), Faculdade de Engenharia e Ciências, Guaratinguetá | pt |