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Elucidating capacitance and resistance terms in confined electroactive molecular layers

dc.contributor.authorBueno, Paulo Roberto [UNESP]
dc.contributor.authorFabregat-Santiago, Francisco
dc.contributor.authorDavis, Jason J.
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionUniversitat Jaume i
dc.contributor.institutionUniversity of Oxford
dc.date.accessioned2014-05-27T11:27:33Z
dc.date.available2014-05-27T11:27:33Z
dc.date.issued2013-01-02
dc.description.abstractElectrochemical analyses on confined electroactive molecular layers, herein exemplified with electroactive self-assembled monolayers, sample current contributions that are significantly influenced by additional nonfaradaic and uncompensated resistance effects that, though unresolved, can strongly distort redox analysis. Prior work has shown that impedance-derived capacitance spectroscopy approaches can cleanly resolve all contributions generated at such films, including those which are related to the layer dipolar/electrostatic relaxation characteristics. We show herein that, in isolating the faradaic and nonfaradaic contributions present within an improved equivalent circuit description of such interfaces, it is possible to accurately simulate subsequently observed cyclic voltammograms (that is, generated current versus potential patterns map accurately onto frequency domain measurements). Not only does this enable a frequency-resolved quantification of all components present, and in so doing, a full validation of the equivalent circuit model utilized, but also facilitates the generation of background subtracted cyclic voltammograms remarkably free from all but faradaic contributions. © 2012 American Chemical Society.en
dc.description.affiliationInstituto de Química Universidade Estadual Paulista, CP 355, 14800-900 Araraquara, São Paulo
dc.description.affiliationGrup de Dispositius Fotovotaics i OptoelectroÌnics Departament de Física Universitat Jaume i, Av. Sos Baynat, s/n, 12071 Castelló de la Plana
dc.description.affiliationDepartment of Chemistry University of Oxford, South Parks Road, Oxford OX1 3QZ
dc.description.affiliationUnespInstituto de Química Universidade Estadual Paulista, CP 355, 14800-900 Araraquara, São Paulo
dc.format.extent411-417
dc.identifierhttp://dx.doi.org/10.1021/ac303018d
dc.identifier.citationAnalytical Chemistry, v. 85, n. 1, p. 411-417, 2013.
dc.identifier.doi10.1021/ac303018d
dc.identifier.issn0003-2700
dc.identifier.issn1520-6882
dc.identifier.lattes0477045906733254
dc.identifier.orcid0000-0003-2827-0208
dc.identifier.scopus2-s2.0-84871816157
dc.identifier.urihttp://hdl.handle.net/11449/74342
dc.identifier.wosWOS:000313156500061
dc.language.isoeng
dc.relation.ispartofAnalytical Chemistry
dc.relation.ispartofjcr6.042
dc.relation.ispartofsjr2,362
dc.relation.ispartofsjr2,362
dc.rights.accessRightsAcesso restrito
dc.sourceScopus
dc.subjectCapacitance spectroscopy
dc.subjectCircuit description
dc.subjectCyclic voltammograms
dc.subjectElectroactive
dc.subjectElectrochemical analysis
dc.subjectEquivalent circuit model
dc.subjectFrequency domain measurement
dc.subjectMolecular layer
dc.subjectSelf assembled monolayers
dc.subjectCapacitance
dc.titleElucidating capacitance and resistance terms in confined electroactive molecular layersen
dc.typeArtigo
dcterms.licensehttp://pubs.acs.org/paragonplus/copyright/jpa_form_a.pdf
dspace.entity.typePublication
unesp.author.lattes0477045906733254[1]
unesp.author.orcid0000-0003-2827-0208[1]
unesp.campusUniversidade Estadual Paulista (UNESP), Instituto de Química, Araraquarapt
unesp.departmentFísico-Química - IQARpt

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