Logotipo do repositório
 

Publicação:
Impact of Positive Charges in a Fringing Field Bio-Tunnel-FET Device with Source Underlap

dc.contributor.authorMacambira, Christian N.
dc.contributor.authorAgopian, Paula G. D. [UNESP]
dc.contributor.authorMartino, Joao A.
dc.contributor.authorIEEE
dc.contributor.institutionUniversidade de São Paulo (USP)
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)
dc.date.accessioned2023-07-29T11:49:29Z
dc.date.available2023-07-29T11:49:29Z
dc.date.issued2021-01-01
dc.description.abstractIn this paper, the sensitivity of the fringing field ntype tunneling field-effect transistor biosensor (Bio-nTFET) was investigated over the influence of positive fixed charges density (QBio) and dielectric constant k, in the source underlap (LUS) region. Numerical simulations were performed using Sentaurus TCAD device simulator. The presence of different biomolecules, in the LUS region, affects the drain current of the on-state (IOn). It is shown that the sensitivity of the Bio-nTFET increases 3 orders of magnitude from k = 1 to k = 10 due to the improved fringing field that reduces the tunneling length resulting in a higher tunneling current. The sensibility also increases for a higher values of QBio. The highest sensitivity value obtained in this work was 6.103 A/A for Q(Bio) = 1.10(12) cm(-2) and k = 10. The proposed device shows great potential as a biosensor based on TFET devices.en
dc.description.affiliationUniv Sao Paulo, LSI PSI USP, Sao Paulo, Brazil
dc.description.affiliationSao Paulo State Univ, UNESP, Sao Joao Da Boa Vista, Brazil
dc.description.affiliationUnespSao Paulo State Univ, UNESP, Sao Joao Da Boa Vista, Brazil
dc.description.sponsorshipFundação de Amparo de Pesquisa do Estado de São Paulo (FAPESP)
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.description.sponsorshipCoordenação de Aperfeiçoamento de Pessoa de Nível Superior (CAPES)
dc.format.extent4
dc.identifierhttp://dx.doi.org/10.1109/LAEDC51812.2021.9437937
dc.identifier.citation2021 IEEE Latin America Electron Devices Conference (laedc). New York: IEEE, 4 p., 2021.
dc.identifier.doi10.1109/LAEDC51812.2021.9437937
dc.identifier.urihttp://hdl.handle.net/11449/245245
dc.identifier.wosWOS:000948082600024
dc.language.isoeng
dc.publisherIeee
dc.relation.ispartof2021 Ieee Latin America Electron Devices Conference (laedc)
dc.sourceWeb of Science
dc.subjectBiosensor
dc.subjectBio-TFET
dc.subjectFringing Field
dc.subjectSource Underlap
dc.subjectSensitivity
dc.subjectPermittivity
dc.titleImpact of Positive Charges in a Fringing Field Bio-Tunnel-FET Device with Source Underlapen
dc.typeTrabalho apresentado em eventopt
dcterms.licensehttp://www.ieee.org/publications_standards/publications/rights/rights_policies.html
dcterms.rightsHolderIeee
dspace.entity.typePublication
unesp.campusUniversidade Estadual Paulista (UNESP), Faculdade de Engenharia, São João da Boa Vistapt

Arquivos