Publicação: Impact of Positive Charges in a Fringing Field Bio-Tunnel-FET Device with Source Underlap
dc.contributor.author | Macambira, Christian N. | |
dc.contributor.author | Agopian, Paula G. D. [UNESP] | |
dc.contributor.author | Martino, Joao A. | |
dc.contributor.author | IEEE | |
dc.contributor.institution | Universidade de São Paulo (USP) | |
dc.contributor.institution | Universidade Estadual Paulista (UNESP) | |
dc.date.accessioned | 2023-07-29T11:49:29Z | |
dc.date.available | 2023-07-29T11:49:29Z | |
dc.date.issued | 2021-01-01 | |
dc.description.abstract | In this paper, the sensitivity of the fringing field ntype tunneling field-effect transistor biosensor (Bio-nTFET) was investigated over the influence of positive fixed charges density (QBio) and dielectric constant k, in the source underlap (LUS) region. Numerical simulations were performed using Sentaurus TCAD device simulator. The presence of different biomolecules, in the LUS region, affects the drain current of the on-state (IOn). It is shown that the sensitivity of the Bio-nTFET increases 3 orders of magnitude from k = 1 to k = 10 due to the improved fringing field that reduces the tunneling length resulting in a higher tunneling current. The sensibility also increases for a higher values of QBio. The highest sensitivity value obtained in this work was 6.103 A/A for Q(Bio) = 1.10(12) cm(-2) and k = 10. The proposed device shows great potential as a biosensor based on TFET devices. | en |
dc.description.affiliation | Univ Sao Paulo, LSI PSI USP, Sao Paulo, Brazil | |
dc.description.affiliation | Sao Paulo State Univ, UNESP, Sao Joao Da Boa Vista, Brazil | |
dc.description.affiliationUnesp | Sao Paulo State Univ, UNESP, Sao Joao Da Boa Vista, Brazil | |
dc.description.sponsorship | Fundação de Amparo de Pesquisa do Estado de São Paulo (FAPESP) | |
dc.description.sponsorship | Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq) | |
dc.description.sponsorship | Coordenação de Aperfeiçoamento de Pessoa de Nível Superior (CAPES) | |
dc.format.extent | 4 | |
dc.identifier | http://dx.doi.org/10.1109/LAEDC51812.2021.9437937 | |
dc.identifier.citation | 2021 IEEE Latin America Electron Devices Conference (laedc). New York: IEEE, 4 p., 2021. | |
dc.identifier.doi | 10.1109/LAEDC51812.2021.9437937 | |
dc.identifier.uri | http://hdl.handle.net/11449/245245 | |
dc.identifier.wos | WOS:000948082600024 | |
dc.language.iso | eng | |
dc.publisher | Ieee | |
dc.relation.ispartof | 2021 Ieee Latin America Electron Devices Conference (laedc) | |
dc.source | Web of Science | |
dc.subject | Biosensor | |
dc.subject | Bio-TFET | |
dc.subject | Fringing Field | |
dc.subject | Source Underlap | |
dc.subject | Sensitivity | |
dc.subject | Permittivity | |
dc.title | Impact of Positive Charges in a Fringing Field Bio-Tunnel-FET Device with Source Underlap | en |
dc.type | Trabalho apresentado em evento | pt |
dcterms.license | http://www.ieee.org/publications_standards/publications/rights/rights_policies.html | |
dcterms.rightsHolder | Ieee | |
dspace.entity.type | Publication | |
unesp.campus | Universidade Estadual Paulista (UNESP), Faculdade de Engenharia, São João da Boa Vista | pt |