Publicação: Strong and fast phase modulation for quantitative analysis of photorefractive gratings
dc.contributor.author | Freschi, A. A. | |
dc.contributor.author | Dos Santos, P. V. | |
dc.contributor.author | Frejlich, J. | |
dc.contributor.institution | Universidade Estadual Paulista (Unesp) | |
dc.contributor.institution | Universidade Estadual de Campinas (UNICAMP) | |
dc.date.accessioned | 2014-05-20T15:23:10Z | |
dc.date.available | 2014-05-20T15:23:10Z | |
dc.date.issued | 2006-05-01 | |
dc.description.abstract | A new approach for studying photorefractive gratings in two-wave mixing experiments by a phase modulation technique is presented. The introduction of a large-amplitude, high-frequency sinusoidal phase modulation in one of the input beams blurs the interference pattern and provides powerful harmonic signals for accurate measurements of the grating diffraction efficiency eta and the output phase shift rho between the transmitted and diffracted waves. The blurring of the light fringes can be used to suppress the higher spatial harmonics of the grating, allowing a space-charge field with sinusoidal profile to be recorded. Although the presence of such a strong phase modulation affects the beam coupling in a rather complicated way, it is shown that for the special case of equal intensity input beams, the effect of the phase modulation on eta and rho is reduced to a weakening of the coupling strength. The potentialities of the technique are illustrated in a study of refractive-index waves excited by running interference patterns in a Bi12TiO20 crystal. Expressions for the diffraction efficiency and the output phase shift are derived and used to match numerically calculated curves to the experimental data. The theoretical model is supported by the very good data fitting and allows the computation of important material parameters. | en |
dc.description.affiliation | Univ Estadual Paulista, Dept Fis, IGCE, BR-13500970 Rio Claro, SP, Brazil | |
dc.description.affiliation | Univ Estadual Campinas, Lab Opt, IFGW, BR-13083970 Campinas, SP, Brazil | |
dc.description.affiliationUnesp | Univ Estadual Paulista, Dept Fis, IGCE, BR-13500970 Rio Claro, SP, Brazil | |
dc.format.extent | 279-284 | |
dc.identifier | http://dx.doi.org/10.1007/s00340-006-2145-x | |
dc.identifier.citation | Applied Physics B-lasers and Optics. New York: Springer, v. 83, n. 2, p. 279-284, 2006. | |
dc.identifier.doi | 10.1007/s00340-006-2145-x | |
dc.identifier.issn | 0946-2171 | |
dc.identifier.uri | http://hdl.handle.net/11449/34013 | |
dc.identifier.wos | WOS:000236750700021 | |
dc.language.iso | eng | |
dc.publisher | Springer | |
dc.relation.ispartof | Applied Physics B: Lasers and Optics | |
dc.relation.ispartofjcr | 1.881 | |
dc.relation.ispartofsjr | 0,740 | |
dc.rights.accessRights | Acesso restrito | |
dc.source | Web of Science | |
dc.title | Strong and fast phase modulation for quantitative analysis of photorefractive gratings | en |
dc.type | Artigo | |
dcterms.license | http://www.springer.com/open+access/authors+rights?SGWID=0-176704-12-683201-0 | |
dcterms.rightsHolder | Springer | |
dspace.entity.type | Publication | |
unesp.author.orcid | 0000-0003-1494-0063[1] | |
unesp.campus | Universidade Estadual Paulista (UNESP), Instituto de Geociências e Ciências Exatas, Rio Claro | pt |
unesp.department | Física - IGCE | pt |
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