Publicação: Structural and spectroscopic properties of Eu3+ doped Y4Al2O9 compounds through a soft chemical process
Carregando...
Arquivos
Data
Orientador
Coorientador
Pós-graduação
Curso de graduação
Título da Revista
ISSN da Revista
Título de Volume
Editor
Tipo
Artigo
Direito de acesso
Acesso aberto

Resumo
The present work reports on the synthesis, structural and optical properties of (Y1-xEux)4Al2O9 powders, with x ranging from 0.001 to 0.030. We prepared the materials using a modified polymeric precursors method, and the effect of annealing temperature and Eu3+ concentrations were evaluated. Structural and microstructural parameters, such as cell parameters, crystallite size and grain size were determined and evaluated by using the results from X-ray diffraction and high-resolution transmission electron microscopy techniques. An annealing temperature of 800 °C was enough to obtain single Y4Al2O9 crystalline phase with good distribution of Eu3+ ions. Diffuse reflectance spectra and optical bandgap of 4.52 eV for (Y0.995Eu0.005)4Al2O9 – determined by Kubelka-Munk model – showed good optical quality of the samples, which were considered non-conducting. All doped samples possessed visible photoluminescence emission from Eu3+ ions under excitation at 393 nm, with higher emissions occurring in the red region from 5D0 → 7F2 transition, with R/O relation of 1.69 for the sample with x = 0.010. Analyzing photoluminescence emission spectra, the lifetime values and Judd-Ofelt parameters, we determined that Eu3+ occupied three different sites of the Y4Al2O9 (YAM) structure, replacing Y3+ ions, with the quenching concentration occurring between x = 0.020 and x = 0.030. We noted that Eu3+ ions are in a chemical environment with low polarization, and their degree of covalence is low. Finally, samples with x = 0.020 (Y0.980Eu0.020)4Al2O9 seems to be useful as red phosphors.
Descrição
Palavras-chave
Europium, Judd-Ofelt intensity parameters, Occupation sites, Visible emissions, YAM
Idioma
Inglês
Como citar
Journal of Luminescence, v. 204, p. 513-519.