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Structural and electrical properties of SrBi2(Ta0.5Nb0.5)(2)O-9 thin films

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dc.contributor.authorAmsei Junior, N. L. [UNESP]
dc.contributor.authorSimões, Alexandre Zirpoli [UNESP]
dc.contributor.authorPianno, R. F. C. [UNESP]
dc.contributor.authorZanetti, S. M.
dc.contributor.authorLongo, Elson [UNESP]
dc.contributor.authorVarela, José Arana [UNESP]
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionInstituto Nacional de Pesquisas Espaciais (INPE)
dc.date.accessioned2014-05-20T15:32:10Z
dc.date.available2014-05-20T15:32:10Z
dc.date.issued2008-06-30
dc.description.abstractSrBi2(Ta0.5Nb0.5)(2)O-9 (SBTN) thin films were obtained by polymeric precursor method on Pt/Ti/SiO2/Si(1 0 0) substrates. The film is dense and crack-free after annealing at 700 degrees C for 2 h in static air. Crystallinity and morphological characteristic were examined by X-ray diffraction (XRD), field emission scanning electron microscopy (FEG-SEM) and atomic force microscopy (AFM). The films displayed rounded grains with a superficial roughness of 3.5 nm. The dielectric permittivity was 122 with loss tangent of 0.040. The remanent polarization (P-r) and coercive field (E-c) were 5.1 mu C/cm(2) and 96 kV/cm, respectively. (C) 2007 Published by Elsevier B.V.en
dc.description.affiliationUniv Estadual Paulista, Inst Quim, BR-14801970 Araraquara, SP, Brazil
dc.description.affiliationINPE, BR-12228900 Sao Jose Dos Campos, Brazil
dc.description.affiliationUnespUniv Estadual Paulista, Inst Quim, BR-14801970 Araraquara, SP, Brazil
dc.format.extent500-503
dc.identifierhttp://dx.doi.org/10.1016/j.jallcom.2007.04.039
dc.identifier.citationJournal of Alloys and Compounds. Lausanne: Elsevier B.V. Sa, v. 458, n. 1-2, p. 500-503, 2008.
dc.identifier.doi10.1016/j.jallcom.2007.04.039
dc.identifier.issn0925-8388
dc.identifier.lattes3573363486614904
dc.identifier.urihttp://hdl.handle.net/11449/41140
dc.identifier.wosWOS:000256641200088
dc.language.isoeng
dc.publisherElsevier B.V. Sa
dc.relation.ispartofJournal of Alloys and Compounds
dc.relation.ispartofjcr3.779
dc.relation.ispartofsjr1,020
dc.rights.accessRightsAcesso restrito
dc.sourceWeb of Science
dc.subjectferroelectricen
dc.subjectchemical synthesisen
dc.subjectthin filmsen
dc.subjectnanostructuresen
dc.titleStructural and electrical properties of SrBi2(Ta0.5Nb0.5)(2)O-9 thin filmsen
dc.typeArtigo
dcterms.licensehttp://www.elsevier.com/about/open-access/open-access-policies/article-posting-policy
dcterms.rightsHolderElsevier B.V. Sa
dspace.entity.typePublication
unesp.author.lattes3573363486614904
unesp.campusUniversidade Estadual Paulista (UNESP), Instituto de Química, Araraquarapt
unesp.campusUniversidade Estadual Paulista (UNESP), Faculdade de Engenharia, Guaratinguetápt
unesp.departmentMateriais e Tecnologia - FEGpt
unesp.departmentBioquímica e Tecnologia - IQARpt
unesp.departmentFísico-Química - IQARpt

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Guaratinguetá - FEG - Faculdade de Engenharia e Ciências
Araraquara - IQAR - Instituto de Química